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11@Semiconductors
A (Silicon) |
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Aug. 29 (Tue.) |
Aug. 30 (Wed.) |
Aug. 31 (Thu.) |
Sept. 1 (Fri.) |
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11.1 Fundamental Materials Characterization and Evaluation | ƒR-ZN@13:00`18:00 | |||||||
11.2 Surface | ƒR-ZN@10:00`13:00 | ƒR-ZN@14:00`16:30 | ||||||
11.3 Gate Insulator Technology | P5(poster session only) @9:30`11:30 | P10(poster session only) @9:30`11:30 | P12(poster session only) @13:00`15:00 | |||||
11.4 Review Lectures and General Session:Historical review on LSI multi-level interconnect technology and the on-going evolution toward nanometers-scaling | ƒR-ZW@10:00`12:10 | ƒR-ZW@13:10`16:45 | ||||||
11.4 Interconnect Technology | ƒR-ZN@10:00`13:00 | ƒR-ZN@14:00`19:00 | ƒR-ZN@9:00`12:00 | |||||
11.5 Si Process Technology | ƒR-ZQ@10:00`13:00 | ƒR-ZQ@14:00`17:30 | ƒR-ZQ@10:00`13:00 | ƒR-ZQ@14:00`19:00 | ƒR-ZQ@10:00`12:45 | ƒR-ZQ@14:00`18:45 | ||
11.6 Si Devices/Integration Technology | ƒR-ZR@10:00`13:00 | ƒR-ZR@14:00`16:30 | ƒR-ZR@10:00`13:00 | ƒR-ZR@14:00`17:15 | ƒR-ZR@10:00`13:00 | |||
11.7 Simulation | ƒR-ZR@14:00`18:30 |