OYO BUTURI Vol.88 No.9 (2019)
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Degradation analysis of OLEDs by steady-state and time-resolved photoluminescence

Hideyuki MURATA1

Due to the practical importance of the display applications of light emitting diodes (OLED), understanding the degradation processes of OLEDs has received a considerable amount of scientific attention. I have demonstrated an analytical method for degradation in the emitting layer of phosphorescent OLEDs by combining steady-state and time-resolved photoluminescence (PL) measurements. We found the degradation of the OLED takes place due to the generation of a quencher, which results in a decrease in both the PL quantum yield (PLQY) and the radiative recombination efficiency. With this method, we clarify the model of the degradation mechanism of the OLED, where the contribution of the PLQY and the radiative recombination efficiency to the decrease in electroluminescent has been determined semiquantitatively.

  • 1 School of Materials Science, Japan Advanced Institute of Science and Technology
OYO BUTURI Vol.88 No.9 p.604 (2019)