Characterization of the optical properties of nanomaterials by high-resolution EELS
Ryosuke SENGA1, Kazutomo SUENAGA1
Recent developments with a monochromator for transmission electron microscopes have enabled us to measure the physical properties of materials beyond a simple structural analysis by means of electron spectroscopy. With a high-energy resolution down to a few tens of electron volts, we can now access optical properties or detailed electron structures of materials, which, so far, have been only measured by light or X-ray probes, at a nanometer scale. Such local spectroscopy will open up a wide range of possibilities to unravel the defect physics of quantum matter.
- 1 National Institute of Advanced Industrial Science and Technology（AIST）