OYO BUTURI
Vol.87
No.11
2018
11
2018118711828
OYO BUTURI Vol.87 No.11 (2018)
Our Research

Direct electric field imaging inside atoms

Naoya SHIBATA1,2

The spatial resolution of aberration-corrected scanning transmission electron microscopy (STEM) has now become better than 0.5 Å. Combining such an ultrahigh resolution STEM with a differential phase contrast (DPC) imaging technique, we can now directly visualize the electric field distribution inside individual atoms in real space. This atomic electric field, i.e. the field between the nucleus of the atom and the electron cloud that surrounds it, should contain information about the atomic species and the charge redistribution due to chemical bonding. In this report, the current status of atomic-resolution DPC STEM and its future direction are discussed.

  • 1 Institute of Engineering Innovation, School of Engineering, The University of Tokyo
  • 2 NSRL, Japan Fine Ceramics Center
OYO BUTURI Vol.87 No.11 p.828 (2018)