OYO BUTURI
Vol.87
No.9
2018
9
20189879674
OYO BUTURI Vol.87 No.9 (2018)
Our Research

Measurement of electronegativity of individual atoms

Yoshiaki SUGIMOTO1, Jo ONODA2

Non-contact atomic force microscopy (AFM) is one of the most powerful imaging techniques. Using AFM, one can measure individual atomic forces between the tip apex atoms and surface atoms. This unique technique allows us to verify the nature of the chemical bond established by Pauling along with the progress of quantum chemistry. Understanding the individual chemical bonds can be applied to atomic level surface analyses such as chemical identification and the characterization of single atoms on various surfaces. Here, we explain the method for the determination of the electronegativity of individual surface atoms.

  • 1 Graduate School of Frontier Sciences, The University of Tokyo
  • 2 Department of Physics, University of Alberta
OYO BUTURI Vol.87 No.9 p.674 (2018)