15 Science and Technology of Crystals |
15.1 Bulk Crystal Growth |
Sept. 14 9:30`12:30 |
14a-ZT - 1`12 |
|
1 |
Second harmonic generation property of MgO-doped LiNbO3 bulk single crystal having the stoichiometric composition coincident with its stoichiometric composition |
IMR Tohoku Univ.1, CIR Tohoku Univ.2@Hiromitsu Kimura1, Haruhiko Koizumi1, Kazumasa Sugiyama1, Tetsuo Taniuchi2, Satoshi Uda1 |
’ |
2 |
Growth and spectroscopy of Nd doped KLiLuF5 single crystals |
IMRAM Tohoku Univ.1, TOKUYAMA corp.2, New Industry Creation Hatchery Center (NICHe)3, IMR Tohoku Univ.4@iM2jYuki Furuya1, Hidehiko Tanaka1, Noriaki Kawaguchi1,2, Takayuki Yanagida1, Yuui Yokota1, Kazumasa Sugiyama4, Akira Yoshikawa1,3 |
’ |
3 |
Crystal growth of Nd doped CaF2
single crystal for VUV scintillator by Czochralski method |
IMR1, IMRAM2, TOKUYAMA corp3, NICHe4@iM2jHidehiko Tanaka1,2, Yuki Furuya2, Noriaki Kawaguchi2,3, Yui Yokota2, Takayuki Yanagida2, Yoshiyuki Kawazoe1, Akira Yoshikawa4 |
’ |
4 |
Crystal growth and scintillation properties of Nd-doped Lu3Al5O12 single crystals |
IMRAM, Tohoku University1, NICHe, Tohoku University2@Makoto Sugiyama1, Yutaka Fujimoto1, Takayuki Yanagida1, Yokota Yuui1, Yoshikawa Akira1,2 |
|
5 |
Study on the correlation between crystallinity and scintillation properties in Pr:LuAG single crystal |
Tohoku Univ.1, Furukawa Co. Ltd.2, NICHe, Tohoku Univ.3@Akihiro Yamaji1, Takayuki Yanagida1, Yuuki Furuya1, Kei Kamada2, Akira Yoshikawa1,3 |
|
6 |
Growth and scintillation properties of Ce: (Gd,Y)3Al5O12(GYAG) single Crystals |
Furukawa co. ltd.1, IMRAM, Tohoku Univ.2@Kei Kamada1, Takayuki Yanagida2, Yuu Fujimoto2, Akihiro Fukabori2, Yoshiyuki Usuki1, Akira Yoshikawa2 |
|
7 |
Growth and optical property of Al doped CsLiB6O10 |
Graduate School of Eng., Osaka Univ.1, CREST-JST2@Yuji Fukushima1,2, Yusuke Mizobe1,2, Yoshinori Takahashi1,2, Masashi Yoshimura1,2, Yushi Kaneda1,2, Yasuo Kitaoka1,2, Yusuke Mori1,2, Takatomo Sasaki1,2 |
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8 |
Growth of shaped and multiple sapphire crystals by a micro-pulling-down method |
IMRAM Tohoku Univ.1, TDK2, NICHe Tohoku Univ.3@Yuui Yokota1, Valery Chani1, Masato Sato1,2, Kazushige Tota2, Ko Onodera2, Takayuki Yanagida1, Akira Yoshikawa1,3 |
|
9 |
Growth and properties of alkali metal doped potassium niobate crystals |
NIMS1, Univ. Wollongong2@Hideo Kimura1, Rumi Tanahashi1, Hongyang Zhao1, Zhenxiang Cheng2, Xiaollin Wang2 |
|
10 |
Characteristics of oxygen in germanium crystals Czochralski-grown from B2O3-covered melt |
Shinshu Univ. (ICST)1, Shinshu Univ. (Eng)2, Tohoku Univ. (IMR)3@Toshinori Taishi1, Yoshio Hashimoto2, Hideaki Ise3, Takayuki Osawa3, Ichiro Yonenaga3 |
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11 |
Development of three dimensional X-ray topography using synchrotron radiation and observation of dislocation distribution in the neck-part of CZ-silicon crystals
|
JASRI1, Univ.Toyama2, Saga-LS3@Kentaro Kajiwara1, Satoshi Iida2, Seiji Kawado3 |
£’ |
12 |
The effect of gravity on the dissolution process of GaSb into InSb melt: Experiment and simulation |
RIE Shizuoka Univ.1, Osaka Univ.2, Shizuoka Insti Sci. and Tech.3, JAXA4@Rajesh Govindasamy1, Arivanandhan Mukannan1, Hisashi Morii1, Natsuki Suzuki1, Toru Aoki1, Tadanobu Koyama1, Yoshimi Momose1, Akira Tanaka1, Sankaranarayanan Krishnasamy1, Yasunori Okano2, Tetsuo Ozawa3, Yuko Inatomi4, Yasuhiro Hayakawa1 |
15.2 II-VI Crystals |
Sept. 14 13:45`17:30 |
14p-ZT - 1`14 |
|
1 |
Photoluminescence of stacked structure of CdSe quantum dots fabricated by an alternate molecular beam supply (II) |
Okayama University of Science1@Yuto Banden1, Masakazu Ohishi1, Hiroshi Saito1, Minoru Yoneta1 |
|
2 |
Investigation of luminescence properties of BeZnSeTe II-VI compound semiconductor quaternaries grown on InP substrates. |
Sophia Univ.1@Kazuki Muraishi3, Ichirou Nomura1, Ramesh Vadivelu1, Yutaka Sawafuji1, Kastumi Kishino1 |
|
3 |
Room-temperature CW operation of BeZnCdSe-quantum-well green laser diodes |
AIST1, Hitachi2, Sony3@Jun-ichi Kasai1, Ryouichi Akimoto1, Haruhiko Kuwatsuka1, Toshifumi Hasama1, Hiroshi Ishikawa1, Sumiko Fujisaki2, Takeshi Kikawa2, Shigehisa Tanaka2, Shinji Tsuji2, Hiroshi Nakajima3, Kunihiko Tasai3, Yoshiro Takiguchi3, Tsunenori Asatsuma3, Koshi Tamamura3 |
|
4 |
Growth and Characterization of ZnTe/ZnMgTe quantum well structures by molecular beam epitaxy |
Saga Univ.1@hiroshi OHshita1, Tooru Tanaka1, katsuhiko saitou1, Qixin Guo1, mituhiro nishio1 |
|
5 |
Light switching driven by light of ZnSe-ZnTe dual sub-band superlattices |
Hokkaido Inst. of Tech.1@Kazuya Takahashi1, Taisuke Yamamoto1, Makoto Abe1, Naohito Kimura1, Nobuyuki Kimura1, Takayuki Sawada1, Kazuhiko Suzuki1, Kazuaki Imai1 |
’ |
6 |
Optical Properties and Structural Characterization of Zn-Cd-Mn-Se DQWs |
Univ of Yamanashi1@Fumiaki Iwasaki1, Masao Hishikawa1, Sakyo Fukasawa1, Tsutomu Muranaka1, Yoichi Nabetani1, Takashi Matsumoto1 |
’ |
7 |
MBE-VLS growth of ZnTe nanowires on ZnTe substrates |
Saga Univ1@Tomohiro Mochinaga1, Hiroshi Ohshita1, Tooru Tanaka1, Katsuhiko Saito1, Qixin Guo1, Mitsuhiro Nishio1 |
’ |
8 |
Self-organization of PbSnTe nanodots and their emission in mid-infrared region |
Osaka Inst.of Tech1@iM1jYuuki Nakata, Kazuto Koike, Mitsuaki Yano |
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Break 15:45`16:00 |
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’ |
9 |
Low Temperature Grown Ga Dope ZnO Films (1) -Electrical Property- |
Univ of Yamanshi1, Nakaya Corporation2, Yamanashi Industrial Technology3@Takahiro Horii1, Shiho Sano1, Tsutomu Muranaka1, Yoichi Nabetani1, Takashi Matsumoto1, Satoshi Hiraki2, Hideaki Furukawa2, Akihiro Fukasawa2, Shingo Sakamoto2, Shigeru Hagihara3, Yuu Kono3, Kazuhiro Kijima3, Osamu Abe3, Kouji Yashiro3 |
’ |
10 |
Low Temperature Grown Ga-doped ZnO Films (2) - XRD Properties - |
Univ. of Yamanashi1, Nakaya Corporation2, Yamanashi Industrial Tecnology Center3@Shiho Sano1, Takahiro Horii1, Tsutomu Muranaka1, Yoiti Nabetani1, Takashi Matsumoto1, Satoshi Hiraki2, Hideaki Furukawa2, Akihiro Fukasawa2, Shingo Sakamoto2, Shigeru Hagihara3, Yu Kono3, Kazuhiro Kijima3, Osamu Abe3, Kozi Yashiro3 |
|
11 |
Persistent Photoconductivity studies on electron-irradiated
single crystal ZnO bulk: Dual light illumination effect
|
Hosei Univ1, Osaka kyouiku Univ2, KURRI3@Takahiro Oga1, Yusuke Izawa1, Kazuo Kuriyama1, Kazumasa Kushida2, Xu Q.3 |
|
12 |
Transient photocurrent characteristics for two ZnO polar faces.4 |
Akita Prefectural Univ1@Yousuke Ishiduka1, Hiroyuki Yamaguchi1, Takao Komiyama1, Yasunori Chonan1, Takashi Aoyama1 |
|
13 |
Investigation of ZnO Thin Film deposited on p-type GaN by Pulse Laser Deposition |
Panasonic ATRL1@Akihiro Itou1, Hiroyuki Tanaka1, Nobuaki Nagao1 |
|
14 |
ZnO nanorods are fabricated by Solid Source CVD method using Au nanoparticles as catalyst |
Univ. of Tokyo.1, Hokkaido Univ.2@Sawako Miyamoto1, Tetsuya Hasegawa1, Toshiki Sakai2, Hajime Kiyono2, Hiroyuki Takahashi2, Tetsu Yonezawa2, Toshihiro Shimada2 |
15.3 III-V Epitaxial Growth |
Sept. 14 9:30`18:00 |
14a-ZV - 1`11 |
|
1 |
Optical characterization of InGaAs/InAlAsP multiple quantum wells |
Frontier Science Innovation Center¨FSIC1, Graduate School of Engineering, Osaka Prefecture University¨Osaka Prefecture Univ.2@Takako Yamamoto1,2, Yuichi Kawamura1,2 |
’ |
2 |
Field Effect of Asymmetric Structure InGaAsP/InAlAs/InP QWs |
Graduate School of Engineering, Osaka Prefecture Univ.,¨OsakaPrefectureUniv.1, Frontier Science Innovation Center¨Frontier Science Center2@Takuya Shouno1,2, Yuichi Kawamura1,2 |
|
3 |
Adjustment of layer on surface side of sine wave composition profile DBR mirror reflectivity optimization for (In)GaAs QWR VCSELs. |
Ehime Univ.1@Satoshi Shimomura1, Kota Osaka1 |
|
4 |
Fabrication of active layer for InGaAs QWR VCSELs |
Ehime univ1@shoji kajitani1, kota osaka, satoshi simomura |
|
5 |
Step motion oh QWR laser structure grown on (775)B InP substrate by MBE |
Ehime univ.1@Yoshiatsu Mitsunari1, Naoyoshi Mouri1, Toyokazu Matsugi1, Satoshi Shimomura1 |
|
6 |
In composition dependency of InGaAs layer surface on (775)B InP substrate |
Ehime Uni.1@Tetsuya Miyata1, Yoshiatsu Mitsunari1, Satoshi Shimomura1 |
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Break 11:00`11:15 |
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£ |
7 |
Effect of growth temperature on surface morphology of the homoepitaxial growth of GaAs on (631)A substrates |
Ehime Univ.1, IICOASLP Univ.2, CINVESTAV-IPN3@David Vazquez-Cortez1, Esteban Cruz-Hernandez2, Victor-Hugo Mendez-Garcia2, Maximo Lopez-Lopez3, Satoshi Shimomura1 |
|
8 |
Structural analysis of compositionally graded InxGa1-xAs/GaAs (001) buffer layers by in situ X-ray reciprocal space mapping |
Toyota Tech. Inst.1, Univ. of Miyazaki2, JAEA3@Takuo Sasaki1, Hidetoshi Suzuki2, Masamitu Takahasi3, Seiji Fujikawa3, Yoshio Ohshita1, Masafumi Yamaguchi1 |
|
9 |
Optical properties of an annealed GaAs quantum well with low-temperaure AlGaAs capping |
NIMS1@iPCjMasafumi Jo1, Takaaki Mano1, Kazuaki Sakoda1 |
|
10 |
Electrical properties of C60 delta-doped GaAs, AlGaAs layers |
Waseda Univ.1, JST PRESTO2, Waseda Univ.3@Jiro Nishinaga1,2, Yoshiji Horikoshi3 |
|
11 |
Thermal Behavior of Defects Generated from GaP/Si Heterointerface |
Toyohashi Univ. Tech.1, ISSRC2@Keisuke Yamane1, Hiroshi Okada2,1, Akihiro Wakahara1,2 |
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Lunch 12:30`13:30 |
|
14p-ZV - 1`17 |
|
1 |
Photoreflectance spectra of dilute GaAsN alloys |
Saitama Univ.1, IMR Tohoku Univ.2, The Univ. of Tokyo3@Wataru Okubo1, Akira Ishikawa1, Shuhei Yagi1, Yasuto Hijikata1, Sadafumi Yoshida1, Ryuji Katayama2, Kentaro Onabe3, Hiroyuki Yaguchi1 |
|
2 |
Effects of uniaxial stress on the luminescence from isoelectronic traps in dilute GaAsN alloys |
Saitama Univ.1, The Univ. of Tokyo2, IMR Tohoku Univ.3@Yuya Arai1, Yuta Endo1, Shuhei Yagi1, Yasuto Hijikata1, Shigeyuki Kuboya2, Kentaro Onabe2, Ryuji Katayama3, Hiroyuki Yaguchi1 |
|
3 |
Nitrogen concentration dependence of the emission from nitrogen pairs in dilute GaAsN alloys |
Saitama Univ.1, ISSP2, Univ. of Tokyo3, IMR Tohoku Univ.4@Akira Ishikawa1, Shuhei Yagi1, Yasuto Hijikata1, Sadafumi Yoshida1, Makoto Okano2, Toshimitsu Mochizuki2, Masahiro Yoshita2, Hidefumi Akiyama2, Shigefumi Kuboya3, Kentaro Onabe3, Ryuji Katayama4, Hiroyuki Yaguchi1 |
|
4 |
Single Photon Emission from a single nitrogen-related luminescence center in GaAs |
Tsukuba Univ.1, PRESTO-JST2, NIMS3@Michio Ikezawa1,2, Yoshiki Sakuma3, Yoshinori Sone1, Liao Zhang1, Takenobu Hamano1, Jun Tatebayashi3, Yasuaki Masumoto1 |
|
5 |
Arrangements of nitrogen atom pairs forming isoelectronic traps in N Β-doped GaAs |
Saitama Univ.1, ISSP2, The Univ. of Tokyo3, IMR Tohoku Univ.4@Shinya Hoshino1, Yuta Endo1, Toshiyuki Fukushima1, Kengo Takamiya1, Shuhei Yagi1, Yasuto Hijikata1, Toshimitsu Mochizuki2, Masahiro Yoshita2, Hidefumi Akiyama2, Shigeyuki Kuboya3, Kentaro Onabe3, Ryuji Katayama4, Hiroyuki Yaguchi1 |
|
6 |
Photoluminescence from isoelectronic traps in N Β-doped GaAs/AlGaAs heterostructures. |
Saitama Univ.1, ISSP2, Univ. of Tokyo3, IMR Tohoku Univ.4, Chulalongkorn Univ.5@kengo Takamiya1, Yuta Endo1, Toshiyuki Fukushima1, Shinya Hoshino1, Shuhei Yagi1, Yasuto Higikata1, Toshimitsu Mochizuki2, Masahiro Yoshita2, Hidefumi Akiyama2, Shigeyuki Kuboya3, Kentaro Onabe3, Ryuji Katayama4, Sanorpim Sakuntam5, Hiroyuki Yaguchi1 |
|
7 |
Band Engineering of III-V Quantum System with Atomic Layer Nitrides |
Osaka Univ.1@Fumitaro Ishikawa1, Masato Morifuji1, Kenichi Nagahara1, Masahiko Kondow1 |
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8 |
Impact of atomic nitride layer insertion on the band structure of AlGaAs/GaAs quantum well |
Osaka Univ.1@Shinichiro Furuse1, Hiroki Nakamoto1, Fumitaro Ishikawa1, Masahiko Kondow1 |
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Break 15:30`15:45 |
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9 |
Origin of Temperature Dependence of Photoluminescence Peak Energy in Ga(In)NA |
ISIR, Osaka University1, Graduate School of Engineering, Osaka Univ.2@Shuichi Emura1, Hiroki Nakamoto2, Fumitaro Ishikawa2, Masahiko KondoQ, Hajime Asahi1 |
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10 |
Potential of GaInNAs QuantumWell for Its Application to Microfabrication Optical Devices |
Osaka Univ.1@Hiroaki Goto1, Hiroki Nakatmoto1, Fumitaro Ishikawa1, Masahiko Kondow1 |
|
11 |
Influence of N-Si bonds in Si-doped GaInNAs(Sb) films |
The Univ. of Tokyo, RCAST1, Lawrence Berkeley National Laboratory, USA2@Naoya Miyashita1, Nazmul Ahsan1, Kin Man Yu2, Wladek Walukiewicz2, Yoshitaka Okada1 |
£ |
12 |
Photo-modulated reflectance analysis of atomic hydrogen-assisted MBE grown GaNAs alloys |
RCAST, The University of Tokyo1, Lawrence Berkeley National Laboratory2, Saga University3@NAZMUL AHSAN1, NAOYA MIYASHITA1, TOORU TANAKA2,3, KIN MAN YU2, WLADEK WALUKIEWICZ2, YOSHITAKA OKADA1 |
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13 |
MOVPE growth of InGaAsN films on Ge (001) substrates (2) |
Tokyo Univ.1, Chulalongkorn Univ.2@Takehiko Kikuchi1, Quang Tu Thieu1, Hiroaki Kato1, Shigeyuki Kuboya1, Sakuntam Sanorpim2, Kentaro Onabe1 |
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14 |
Influence of lattice constraint from substrate on N composition in GaAsN grown by CBE |
RIAM Kyushu Univ.1, Toyota Tech. Inst.2, Tokyo Univ. A.&T.3@iPCjJun Kawano1, Kazuma Ikeda1,2, Yoshihiro Kangawa1, Koichi Kakimoto1, Akinori Koukitu3 |
|
15 |
Stable position of N in GaAsN affected by lattice constraint |
Toyota Tech. Inst.1, RIAM Kyushu Univ.2@Kazuma Ikeda1, Nobuaki Kojima1, Yoshihiro Kangawa2, Koichi Kakimoto2, Yoshio Ohshita1, Masafumi Yamaguchi1 |
’ |
16 |
Effects of off angle substrates on hole mobility in GaAsN grown by chemical beam epitaxy |
Toyota Tech. Inst.1, IR Organization Univ. of Miyazaki2@iDjMakoto Inagaki1, Hidetoshi Suzuki2, Takahiko Honda1, Tomohiro Tanaka1, Kazuma Ikeda1, Suguru Wada1, Nobuaki Kojima1, Yoshio Ohshita1, Masafumi Yamaguchi1 |
|
17 |
Characterization of GaPN films by capacitance-voltage method |
AIST1@Isao Sakata1, Zhengxin Liu, Hitoshi Kawanami |
15.3 III-V Epitaxial Growth |
Sept. 15 9:30`18:00 |
15a-ZV - 1`11 |
|
1 |
Increase of Spectral Width of Stacked InAs Quantum Dots on GaAs by Contralling Spacer Layer Thickness |
Nagoya Univ.1@Kazuma Tani1, Shingo Fuchi1, Toru Ujihara1, Yoshikazu Takeda1 |
|
2 |
Isolation and Distribution of Photoluminescence Emissions from InAs Quantum Dots over a Wide-Wavelength Range
|
NanoQuine, Univ. of Tokyo1, NEC Corp.2, IIS, Univ. of Tokyo3@Shunsuke Ohkouchi1, Naoto Kumagai1, Masayuki Shirane1,2, Yuichi Igarashi1,2, Masahiro Nomura1, Yasutomo Ota1,3, Shinichi Yorozu1,2, Satoshi Iwamoto1,3, Yasuhiko Arakawa1,3 |
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3 |
Multi-color QDs growth for spectrum-shape-controlled broadband light source |
Wakayama Univ.1, NEC Corp.2, NIMS3, Univ. Sheffield4@Nobuhiko Ozaki1, Koichi Takeuchi1, Shunsuke Ohkouchi2, Naoki Ikeda3, Yoshimasa Sugimoto3, Kiyoshi Asakawa3, Richard Hogg4 |
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4 |
Electric properties of Er-doped InAs quantum dots with strain-relaxed barriers |
Univ.of Tokushima1@hyuga ueyama1, tomoya takahashi1, ken morita1, takahiro kitada1, toshiro isu1 |
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5 |
Growth of InAs quantum dots with various charged states utilizing concentric distribution on a wafer
|
NanoQuine, Univ. of Tokyo1, NEC, Green lab.2, IIS, Univ. of Tokyo3@Naoto Kumagai1, Shunsuke Ohkouchi1, Masayuki Shirane1,2, Yuichi Igarashi1,2, Masahiro Nomura1, Yasutomo Ota1,3, Shinichi Yosozu1,2, Satoshi Iwamoto1,3, Yasuhiko Arakawa1,3 |
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Break 10:45`11:00 |
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6 |
PL properties at Room Temperature of low-density InAs Quantum dots on GaAs(001) fabricated by MBE(5) |
Pioneer1, NICT2, Univ.Tokyo3@Yoshinori Sawado1, Katsumi Yoshizawa1, Kouichi Akahane2, Naokatsu Yamamoto2, Tadashi Kawazoe3, Motoichi Ohtsu3 |
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7 |
Observation of PL of InAs QDs in mesa structures on GaAs substrate at room temperature 2 |
Pioneer1, NICT2, Univ.Tokyo3@Katsumi Yoshizawa1, Yoshinori Sawado1, Saburo Aso1, Yasutoshi Hosoda1, Koichi Akahane2, Naokatsu Yamamoto2, Tadashi Kawazoe3, Motoichi Ohtsu3 |
|
8 |
Mechanism of photoluminescence intensity enhancement in directly Si-doped InAs QDs |
Kobe Univ.1@iPjTomoya Inoue1, Kengo Sasayama1, Takashi Kita1 |
|
9 |
Optical gain of multi-stacked InAs quantum dots by strain-compensation technique |
The Univ. of Tokyo, School of Engineering1, The Univ. of Tokyo, RCAST2, NICT3@Ayami Takata1,2,3, Kouichi Akahane2,3, Naokatsu Yamamoto3, Yoshitaka Okada1,2 |
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10 |
Stacking number dependence of intensity characters from InGaAs QDs grown with a higher rate |
Tokyo Metropolitan Univ.1, NICT2@e Tanoue1, Hiroharu Sugawara1, Kouichi Akahane2, Naokatsu Yamamoto2 |
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11 |
Fabrication of 1.06-Κm InGaAs/GaAs high-density-quantum-dot lasers by MBE |
NanoQuine, Univ. of Tokyo1, IIS, Univ. of Tokyo2, QD Laser, Inc.3, Fujitsu Laboratories Ltd.4@Katsuyuki Watanabe1, Tomoyuki Akiyama1,4, Yoshitaka Yokoyama3, Keizo Takemasa3, Kenichi Nishi1,3, Yu Tanaka1,3,4, Mitsuru Sugawara1,3, Yasuhiko Arakawa1,2 |
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Lunch 12:30`13:30 |
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15p-ZV - 1`17 |
’ |
1 |
Self-formation of in-plane ultra-high density InAs quantum-dots and measurements of their carrier lifetime |
Univ. of Electro-Communications1@Jun Ohta1, Koichi Yamaguchi1 |
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2 |
High-density and high-uniformity growth of self-assembled InAs quantum dots |
Univ. of Electro-Communications1@Yutaka Kanemaru1, Naoki Kakuda1, Koichi Yamaguchi1 |
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3 |
Self-formation control of low-density InAs quantum dots by intermittent supply method(5) |
Univ. of Electro-Communications1@Yoshihide Ogawa1, Takuya Yanagisawa2, Koichi Yamaguchi3 |
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4 |
Influence of in-situ CBrCl3 etching on the size and density of InAs dots |
Univ. of Electro-Communications1@Hiroshi Imanishi1, Atsushi Koizumi1, Kazuo Uchida1, Shinji Nozaki1 |
|
5 |
Influence of As4 flux on generation of nuclei of InAs quantum dots on GaAs (001) during MBE growth |
Toyota Tech. Inst.1@Takeo Shirasaka1, Kenichi Shimomura1, Itaru Kamiya1 |
|
6 |
MOVPE growth and characterization of In(Ga)As-quantum dots using Bi as a surfactant IV |
Hirosaki Univ.1, NTT Basic Res. Labs.2@Hiroshi Okamoto1, Takehiko Tawara2, Kouta Tateno2, Hideki Gotoh2, Hidehiko Kamada2, Tetsuomi Sougawa2 |
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7 |
Hydrogen passivation effect to InAs/GaAs quantum dot on the GaInNAs buffer grown by MOCVD |
Έ€1@Kosuke Nemoto1, Ryoichiro Suzuki1, Tomoyuki Sengoku1, Satoru Tanabe1, Rei Nishio1, Fumio Koyama1, Tomoyuki Miyamoto1 |
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8 |
Multiple staking of columnar quantum dots with strain-modulated side-barriers |
PETRA1, Fujitsu Ltd2, Fujitsu Laboratories Ltd3@Shigekazu Okumura1,2, Nami Yasuoka1,2, Kenichi Kawaguchi3, Yu Tanaka1,2, Mitsuru Ekawa3 |
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9 |
Effects of interface grading on electronic states and optical transitions in GaSb type-II quantum dots in GaAs |
NIMS1, Toyota Tech. Inst.2@Takuya Kawazu1, Hiroyuki Sakaki1,2 |
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Break 15:45`16:00 |
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10 |
in situ STM observation of site-controlled nano-dot fabrication during MBE growth |
Anan Natl. Coll. Tech.1@Takashi Toujyou1, Shiro Tsukamoto1 |
£ |
11 |
MOCVD growth of site-controlled quantum dots on substrate patterned by thermal etching |
NanoQuine, Univ. of Tokyo1, IIS,Univ. of Tokyo2, RCAST, Univ. of Tokyo3@Stephane FAURE1, Denis GUIMARD1,2, Masao Nishioka2, Satomi Ishida3, Yasuhiko Arakawa1,2 |
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12 |
Shape Control of InAs/GaAs S-K dots by MBE Selective growth method |
Waseda@University1@Naoyuki Watanabe1, Yuki Wakabayashi1, Hiroaki Serizawa1, Katsuyuki Utaka1 |
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13 |
Shape control of GaAs quantum dots using a thin AlGaAs capping layer |
NIMS1@iPCjMasafumi Jo1, Takaaki Mano1, Kazuaki Sakoda1 |
|
14 |
Fabrication of InAs ring structure on InGaAs/InP by droplet epitaxy |
NIMS1, TTI2@Takeshi Noda1, Takaaki Mano1, Kazuaki Sakoda1, Hiroyuki Sakaki1,2 |
|
15 |
MBE-VLS growth of catalyst-free InAs nanowires on Si substrate |
Nagoya Univ.1, Aichi Inst. of Tech.2@Masahito Yamaguchi1, Isao Horiuchi1, Ji-Hyun Paek1, Nobuhiko Sawaki2 |
|
16 |
Fabrication, structural analyses and optical properties of self-catalyzed GaInP/GaP double-heterostructure core-shell nanowires grown on Si substrates |
NIMS1, UCLA2@iPjJun Tatebayashi1, Yoshiki Sakuma1, Kazuaki Sakoda1, Lin Andrew2, Hicks Robert2, Huffaker Diana2 |
|
17 |
Growth of InGaAs Nanowires on Si(111) Substrate by Selective-Area MOVPE |
GS-IST, RCIQE, Hokkaido Univ.1, JST-PRESTO2@Katsuhro Tomioka1,2, Masatoshi Yoshimura1, Junichi Motohisa1, Shinjiroh Hara1, Kenji Hiruma1, Takashi Fukui1 |
15.3 III-V Epitaxial Growth |
Sept. 16 10:00`17:15 |
16a-ZV - 1`10 |
|
1 |
Fabrication and evaluation of high-density quantum dots solar cell grown on GaAs (311)B substrate |
Univ. of Tsukuba, Inst. of Applied Physics1, The Univ. of Tokyo, RCAST2, The Univ. of Tokyo, School of Engineering3@Yasushi Shoji1,2, Ryuji Oshima2,3, Ayami Takata2,3, Takayuki Morioka2,3, Yoshitaka Okada2,3 |
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2 |
Multi-stacked InAs/GaNAs quantum dots with direct Si doping for use in intermediate band solar cell |
The Univ. of Tokyo, School of Engineering1, The Univ. of Tokyo, RCAST2, Univ. of Tsukuba, Inst. of Applied Physics3, Kobe university, Graduate school of Engineering4@Takayuki Morioka1,2, Ryuji Oshima1,2, Ayami Takata1,2, Yasushi Shoji2,3, Tomoya Inoue4, Takashi Kita4, Yoshitaka Okada1,2 |
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3 |
Optical characteristics of multi-stacked InAs/GaNAs quantum dot solar cell structure |
The Univ. of Tokyo, RCAST1, The Univ. of Tokyo, School of Engineering2, Saitama Univ.3, NICT4@Ryuji Oshima1,2, Ayami Takata1,2, Shuhei Yagi3, Kouichi Akahane4, Ryo Tamaki2, Kenjiro Miyano1, Yoshitaka Okada1,2 |
’ |
4 |
Impurity effect on GaAs solar cells grown by high-material-efficiency MOVPE |
The Univ. of Tokyo1, The Univ. of Tokyo, RCAST2@Ryusuke Onitsuka1, Masakazu Sugiyama1, Yoshiaki Nakano2 |
|
5 |
Interface modification in strain-balanced superlattice solar cells with MOVPE |
RCAST, Univ. of Tokyo1, School of Eng. Univ. of Tokyo2@Yungpeng Wang1, Masakazu Sugiyama2, Yoshiaki Nakano1 |
|
6 |
Examination of abruptness of hetero-interfaces in InGaAs/GaAsP strain-balanced superlattice grown by MOVPE |
School of Eng. Univ. of Tokyo1, RCAST, Univ. of Tokyo2@Masakazu Sugiyama1, Yungpeng Wang, Yoshiaki Nakano |
’ |
7 |
Complete coverage of Si(111) growth windows with InAs and its effect of InGaAs lateral growth in micro-channel selective area MOVPE |
Univ. of Tokyo1, RCAST2@Yoshiyuki Kondo1, Momoko Deura1, Mitsuru Takenaka1, Shinichi Takagi1, Yoshiaki Nakano1,2, Masakazu Sugiyama1 |
|
8 |
Dependence of InAs growth on treatment condition of Si surface using micro-channel selective-area MOVPE |
Univ. of Tokyo1, RCAST2@iDCjMomoko Deura1, Yoshiyuki Kondo1, Mitsuru Takenaka1, Shinichi Takagi1, Yoshiaki Nakano1,2, Masakazu Sugiyama1 |
|
9 |
Fabrication of Fine Ga0.5In0.5P Ridge Structures by Selective Area MOVPE Growth |
AIST1@JongUk Seo1, Xuelun Wang1 |
|
10 |
Low specific contact resistance using heavily Zn-doped InGaAs grown by MOVPE with Sb surfactant
|
NTT Photonics Lab.1@Tomonari Sato1, Manabu Mitsuhara1, Ryuzo Iga1, Shigeru Kanazawa1, Yasuyuki Inoue1 |
|
|
Lunch 12:30`13:30 |
|
16p-ZV - 1`14 |
|
1 |
X-ray CTR scattering analysis on AlAsSb/InGaAs quantum well interfaces for ultra fast optical switch |
Graduate School of Engineering, Nagoya Univ.1, VBL, Nagoya Univ.2, AIST3@iM1jMasanori Masuda1, Masao Tabuchi2, Shinichiro Gozu3, Yoshikazu Takeda1 |
|
2 |
Optical absorption property of In0.64}Ga0.46As/AlxGa1-xAs x
0.2/AlAsSb coupled double quantum wells |
AIST1@Shinichiro Gozu1, Teruo Mozume1, Hiroshi Ishikawa1 |
|
3 |
Growth of InAsSb alloys on GaAs for photodetectors |
HPK1@AKIMASA TANAKA1, TAKAYUKI MIYAKE1, DAISUKE SUMURA1 |
|
4 |
Liquid Phase Electro-Epitaxy of GaSb (001) | Effect of current on the growth | |
Meijo Univ.1@Hidejiro Sato1, Haruki Kojima1, Shigeya Naritsuka1, Takahiro Maruyama1 |
|
5 |
Thermal annealing induced structural changes of TlInGaAsN |
ISIR, Osaka Univ.1@Kang Min Kim1, Shigehiko Hasegawa1, Hajime Asahi1 |
|
6 |
Structural evaluation of MBE-grown GaAs1-xBix mixed crystals by TEM |
Kanazawa Inst. of Tech.1, Kyoto Inst. of Tech.2@Osamu Ueda1, Yoriko Tominaga2, Noriaki Ikenaga1, Masahiro Yoshimoto2, Kunishige Oe2 |
|
7 |
MBE growth of GaAsBi/GaAs superlattices and substrate temperature dependence |
Ehime Univ1@Satosi Shimomura1, Saburou Tanaka1 |
|
|
Break 15:15`15:30 |
|
|
8 |
Suppression of hillock formation for InAs on GaAs(111)A substrate by MBE |
Waseda Univ.1, JST PRESTO2@Kazutaka Iga1, Jiro Nishinaga1,2, Marlene Zander1, Yoshiji Horikoshi1 |
£ |
9 |
Selective area epitaxy of InAs on GaAs(001) by migration-enhanced epitaxy |
Waseda Univ.1, Kagami Memorial Lab.2@Marlene Zander1,2, Jiro Nishinaga1,2, Yoshiji Horikoshi1,2 |
|
10 |
Study of InSb Growth on Patterned SiO2/Si Substrate by Molecular Beam Epitaxy I |
Tokyo University of Science1@Yuichi Nishino1, Tomoaki Iida1, Shinsuke Hara1, Hiroki Fujishiro1 |
’ |
11 |
Study of InSb Growth on Patterned SiO2/Si Substrate by Molecular Beam Epitaxy II |
Tokyo Univ. of Science1@Tomoaki Iida1, Yuuiti Nishino1, Shinsuke Hara1, Hiroki Fujishiro1 |
|
12 |
Size-dependent self-aligned GaAs faceting control by selective thermal etching in UHV |
Kwansei Gakuin Univ.1@iM2jYuki Hirokawa, Taiki Goto, Asuka Ishiwatari, Shoji Ushio, Kazuhiro Matuda, Tadaaki Kaneko |
|
13 |
A role of oxide mask functionality for the formation of faceted structures during MBE-GaAs selective area growth |
Kwansei Gakuin University1@iM1CjSyota Hayashi1, Yuki Hirokawa1, Taiki Goto1, Shoji Ushio1, Kazuhiro Matsuda1, Tadaaki Kaneko1 |
|
14 |
MBE-AlAs selective area growth on Si (100) for studying thermal stability of GaAs oxide mask directly modified by low energy electron beam irradiation |
Kwansei Gakuin Univ.1@iM2jTaiki Goto1, Yuma Yamamoto1, Yuki Hirokawa1, Shoji Ushio1, Kazuhiro Mazda1, Tadaaki Kaneko1 |
15.4 III-V Nitride Epitaxial Growth |
Sept. 14 9:00`11:45 |
14a-A - 1`10 |
|
1 |
Determination of Acoustical Physical Constants of GaN Single Crystals by the Ultrasonic Microspectroscopy Technology |
Tohoku Univ.1@Yuji Ohashi1, Jun-ichi Kushibiki1 |
|
2 |
Formation of Free-standing GaN Film Using beta-Ga2O3 Layer and ZnO Sacrificial Layer |
Ishinomaki Senshu Univ.1@Shinji Nakagomi1, Naoto Miura1, Yoshihiro Kokubun1 |
|
3 |
Formation of a thin GaN layer on the surface of AlN particles by chemical vapor deposition |
Res. Inst. of Elec., Shizuoka Univ.1@Tatsuhiro Mori1, Takayoshi Kobayashi1, Yasumasa Kawanishi1, Hiroko Kominami1, Yoichiro Nakanishi1, Kazuhiko Hara1 |
|
4 |
Hydride vapor-phase epitaxy of GaN using GaCl3 |
Tokyo Univ. of Agri. & Tech.1@Takayoshi Yamane, Koshi Hanaoka, Hideaki Kondoh, Hisashi Murakami, Yoshinao Kumagai, Akinori Koukitu |
|
5 |
Vapor phase growth of GaN (10-10) by the raction between Ga2O vapor and NH3 |
Guraduate School of Engineering, Osaka Univ.1, Itochu Plastics Inc.2@Tomoaki Sumi1, Yuan Bu1, Akira Kitamoto1, Mamoru Imade1, Masashi Yoshimura1, Yasuo Kitaoka1, Takatomo Sasaki1, Yusuke Mori1, Masashi Isemura2 |
|
|
Break 10:15`10:30 |
|
|
6 |
Growth of hexagonal prismatic GaN crystals grown by Ca-doped Na flux method |
Osaka Univ.1@Yusuke Konishi1, Hiroshi Ukegawa1, Taku Fujimori1, Hideo Takazawa1, Kosuke Murakami1, Naoya Miyoshi1, Mamoru Imade1, Masashi Yoshimura1, Yasuo Kitaoka1, Takatomo Sasaki1, Yusuke Mori1 |
|
7 |
Growth habit of GaN crystals grown by Ba-doped Na flux method |
Osaka Univ.1@Hiroshi Ukegawa1, Yusuke Konishi1, Taku Fujimori1, Hideo Takazawa1, Kosuke Murakami1, Naoya Miyoshi1, Mamoru Imade1, Masashi Yoshimura1, Yaasuo Kitaoka1, Takatomo Sasaki1, Yusuke Mori1 |
’ |
8 |
Bulk Growth of GaN single crystal grown on a rod-shaped seed
by Na flux method
|
Osaka Univ.1@Kousuke Murakami1, Hideo Takazawa1, Naoya Miyoshi1, Mamoru Imade1, Masashi Yoshimura1, Yasuo Kitaoka1, Takatomo Sasaki1, Yusuke Mori1 |
|
9 |
Ammonothermal growth of wurtzite GaN crystals using an NH4I mineralizer |
IMRAM Tohoku Univ.1, IMR Tohoku Univ.2, WPI-AIMR3@Yuji Kagamitani1, Taketo Kuribayashi1, Koji Hazu1, Takeyoshi Onuma1, Daisuke Tomida1, Rayko Simura2, Shigefusa Chichibu1, Kazumasa Sugiyama2, Chiaki Yokoyama1, Toru Ishiguro1, Tsuguo Fukuda3 |
|
10 |
Characterization of ammonothermal GaN grown using in-autoclave synthesized acidic mineralizers and GaN homoepitaxial layers grown by MOVPE |
IMRAM, Tohoku Univ.1, WPI-AIMR, Tohoku Univ.2@Shigefusa Chichibu1, Yuji Kagamitani1, Kouji Hazu1, Takeyoshi Onuma1, Tohru Ishiguro1, Tsuguo Fukuda2 |
15.4 III-V Nitride Epitaxial Growth |
Sept. 14 9:00`17:45 |
14a-C - 1`11 |
|
1 |
Correaltion between Growth Mode and Optical Properties of 1ML-InN/GaN Quantum Nanostructure grown by MOVPE |
Chiba Univ.1, Chiba Univ.VBL2@Hiroshi Yamamoto1, Atsushi Ueda1, Tatsuya Ryuzaki1, Kazuhide Kusakabe1,2, Yoshihiro Ishitani1,2, Akihiko Yoshikawa1,2 |
|
2 |
Temperature dependence of photoluminescence properties in N-polar Mg doped InN |
Chiba Univ.1, Chiba Univ. VBL2, Beijing Univ.3@Daichi Imai1, Yoshihiro Ishitani1,2, Masayuki Fujiwara1, Kazuhide Kusakabe1,2, Akihiko Yoshikawa1,2, Wang Xinqiang3 |
|
3 |
Raman scattering characterization of InN films grown by PR-MOVPE |
Kyoto Inst. Technology.1, Wakayama Univ.2, Tohoku Univ.3, JST-CREST4@Yasuhito Kamei1, Junggon Kim1,4, Atsuhito Kimura1, Noriyuki Hasuike1,4, Kenji Kisoda2, Hiroshi Harima1,4, Yuhuai Liu3,4, Takashi Matsuoka3,4 |
’ |
4 |
TEM characterization of microstructure of Mg-doped InN grown using DERI method |
Ritsumeikan Univ.1, R-GIRO2, Seoul National Univ.3@Tsutomu Sakamoto1, Tomohiro Yamaguchi2, Ryosuke Iwamoto1, Tsutomu Araki1, Yasushi Nanishi1,3 |
|
5 |
RF-MBE growth of InN on GaN buffer layer |
Hokkaido Inst, of technology1@Taisuke Yamamoto1, Takayuki Sawada1, Kazuaki Imai1, Naohito Kimura1 |
|
|
Break 10:15`10:30 |
|
|
6 |
MBE growth of GaN thin film on carbonized Si(111). |
Okayama Univ. of science1, Hokkaido Inst. of technology2@iM2jShun-ichiro Nakagawa1, Hirosi Saito1, Masakazu Ohishi1, Kazuaki Imai2 |
|
7 |
GaN growth on pseudo Al substrates by RF-molecular beam epitaxy |
Kogakuin Univ.1@Masato Hayashi1, Taiga Goto1, Tatsuhiro Igaki1, Satoru Taguci1, Tohru Honda1 |
|
8 |
Realization of high-growth-rate GaN homoepitaxy by molecular beam epitaxy using high-density nitrogen radical source |
Graduate School of Engineering, Nagoya Univ.1, Akasaki Research Center, Nagoya Univ.2, Plasma@Nanotechnology Research Center, Nagoya Univ.3, Faculty of Science and Technology, MeijoUniv.4, NU EcoEngineering Co., Ltd.,5, Katagiri Engineering Co., Ltd6@Yohjiro Kawai1,2, Yoshio Honda1,2, Masahito Yamaguchi1,2, Hiroshi Amano1,2, Shang Chen1, Hiroki Kondo1, Mineo Hiramatsu4, Masaru Hori1,3, Hiroyuki Kano5, Kouji Yamakawa6, Shouji Den6 |
’ |
9 |
Effect of growth temperature on surface morphology of selective growth of GaN grown by ammonia-based metal-organic molecular beam epitaxy |
Meijo University1@Chiahung Lin1, Ryota Abe1, Takahiro Maruyama1, Shigeya Naritsuka1 |
|
10 |
Lateral overgrowth accompanying to selective growth of GaN using metal organic molecular beam epitaxy |
Meijo University1@iM2jRyota Abe1, Chiahung Lin1, Takahiro Maruyama1, Shigeya Naritsuka1 |
|
11 |
Influence of ion damage and achievement of high quality due to ion reduction on low temperature growth of GaN films on Si substrates by ECR-plasma MBE method |
Osaka Inst. of Tech.1, Osaka Inst. of Tech. Appl.Phys.2@Tokuo Yodo1, Yoshiyuki Harada2 |
|
|
Lunch 12:00`13:00 |
|
14p-C - 1`17 |
’ |
1 |
Anomalous crystalline orientation dependence of Ga incorporation in high-Al content AlGaN grown by MBE |
Kyoto Univ.1, PESEC2@Shunsaku Ueta1, Masahiro Horita1, Tsunenobu Kimoto1,2, Jun Suda1 |
|
2 |
Growth of Si doped cubic AlGaN films on MgO(001) substrate by RF-MBE |
The Univ. of Tokyo1@Masahiro Kakuda1, Shigeyuki Kuboya1, Kentaro Onabe1 |
|
3 |
Growth of GaN nano-rods on Si(111)by RF-plasma-assisted Molecular Beam Epitaxy
|
Graduate School of Information Science and Technology, Hokkaido Univ.1, RCIQE, Hokkaido Univ.2@iDCjNobuhiro Isomura1, Tamotsu Hasizume2, Junichi Motohisa1 |
|
4 |
Growth and characterization of GaGdN/AlGaN MQDisks (2) |
Osaka Univ., ISIR1@Hiroyuki Tambo1, Mai Uenaka1, Yi-Kai Zhou1, Shuichi Emura1, Shigehiko Hasegawa1, Hajime Asahi1 |
|
5 |
InGa(Gd)N/Ga(Gd)N Superlattice Heterostructures Prepared by MBE |
ISIR Osaka Univ.1@SitiNooraya MohdTawil1, Krishnamurthy Daivasigamani1, Rina Kakimi1, Shuichi Emura1, Shigehiko Hasegawa1, Hajime Asahi1 |
|
|
Break 14:15`14:30 |
|
|
6 |
Structural Analysis of GaGdN by Reciprocal Space Mapping. |
ISIR, Osaka Univ.1, Grad. Sch. Eng., Osaka Univ.2@Kotaro Higashi1, Daijiro Abe1, Yohsuke Mitsuno1, Sachio Komori1, Fumitaro Ishikawa2, Shigehiko Hasegawa1, Hajime Asahi1 |
|
7 |
Positron annihilation study on vacancy-type defects in MBE-grown GaCrN films (2) |
JAEA1, Osaka Univ. ISIR2@iPjAtsushi Yabuuchi1, Masaki Maekawa1, Atsuo Kawasuso1, Shigehiko Hasegawa2, Yi-Kai Zhou2, Hajime Asahi2 |
|
8 |
S-termination effects of Pd-immobilized GaN catalysts |
Anan Natl. Col. Tech.1@Motoi Hirayama1, Yukiko Ueta1, Tomoya Konishi1, Shiro Tsukamoto1 |
|
9 |
Growth of GaN-based single-crystalline layer by UHV sputtering method |
Tokyo Denki Univ1, Bruker AXS K.K.2@Kosuke Sagae1, Yuki Oyamada1, Hiroyuki Shinoda1, Nobuki Mutsukura1, Hitoshi Morioka2, Keisuke Saito2 |
|
10 |
Characterization of annealed GaN-based single-crystalline layer grown by sputtering method |
Tokyo Denki Univ1, Bruker AXS K.K.2@Yuki Oyamada1, Kosuke r
1, Hiroyuki Shinoda1, Nobuki Mutsukura1, Hitoshi Morioka2, Keisuke Saito2 |
|
|
Break 15:45`16:00 |
|
|
11 |
AlN homo-epitaxial growth on sublimation-AlN substrate by low-pressure HVPE |
Mie Univ.1, Nagoya Inst.Tech2, Yamaguchi Univ.3@Takuya Nomura1, Kenta Okumura1, Hideto Miyake1, Kazumasa Hiramatsu1, Osamu Eryuu2, Yoichi Yamada3 |
|
12 |
ELO-AlN on period trench patterned AlN/Sapphire by Low-Pressure HVPE |
Mie Univ.1, RIKEN2@Kohei Fujita1, Hideto Miyake1, Kazumasa Hiramatsu1, Jyun Norimatsu2, Hideki Hirayama2 |
|
13 |
Control of in-plane matching of c-plane AlN layers grown on a-plane sapphire substrates by HVPE |
Tokyo Univ. of Agri. & Tech.1, Tokuyama Corporation2@iDjJumpei Tajima1, Chikashi Echizen1, Rie Togashi1, Hisashi Murakami1, Kazuya Takada2, Yoshinao Kumagai1, Akinori Koukitu1 |
|
14 |
Self Epitaxial Lateral Overgrowth of AlN on 6H-SiC(0001) using non c-axis orientated AlN grains |
Tokyo Univ. of Agri. & Tech.1, Tokuyama Corporation2@Shuhei Sekiguchi1, Masanari Ishizuki2, Rie Togashi1, Hisashi Murakami1, Yoshinao Kumagai1, Kazuya Takada2, Akinori Koukitu1 |
’ |
15 |
Growth of Bulk AlN Single Crystal using Carbothermic Reduced Alumina Vapor Deposition |
Tohoku Univ.1, Tokuyama2@Mikako Kato1, Hidekazu Kobatake1, Makoto Ohtsuka1, Hiroyuki Fukuyama1, Takeshi Hattori2, Masanobu Azuma2, Kazuya Takada2 |
|
16 |
Nitridation of c-plane sapphire surface by high-temperature heating |
Tokyo Univ. of Agri. & Tech.1, Tokuyama Corporation2@Takahiro Igi1, Masanari Ishizuki2, Rie Togashi1, Hisashi Murakami1, Yoshinao Kumagai1, Kazuya Takada2, Akinori Koukitu1 |
|
17 |
Homoepitaxial growth of AlN on nitrided sapphire using Ga-Al binary solution |
IMRAM, Tohoku Univ.1, Sumitomo Metal Mining Co., Ltd.2@iPCjMasayoshi Adachi1, Kazuo Maeda2, Akikazu Tanaka2, Hidekazu Kobatake1, Hiroyuki Fukuyama1 |
15.4 III-V Nitride Epitaxial Growth |
Sept. 14 13:00`18:00 |
14p-NJ - 1`18 |
|
1 |
Growth of In-rich InGaN active layer on selective-area growth of GaN nanocolumns by rf-MBE |
Sophia Univ.1, Sophia NTRC2, CREST JST3@Koichi Kamiyama1, Katsumi Kishino1,2,3, Junpei Kamimura1,3, Ryohei Inoue1, Akihiko Kikuchi1,2,3 |
|
2 |
Selective-area growth of In-rich InGaN nanocolumns by RF-MBE |
Sophia Univ.1, Sophia Nanotech. RC2, CREST JST3@iM1jRyohei Inoue1, Katsumi Kishino1,2,3, Jumpei Kamimura1,3, Kouichi Kamiyama1, Akihiko Kikuchi1,2,3 |
’ |
3 |
Approach for thick InGaN growth using DERI method |
Ritsumeikan Univ. Dept. of Photonics1, Ritsumeikan Univ. R-GIRO2, Seoul National Univ.3@Nao Uematsu1, Tomohiro Yamaguchi2, Ryosuke Iwamoto1, Tsutomu Sakamoto1, Tatsuya Fujishima1, Tsutomu Araki1, Yasushi Nanishi1,3 |
’ |
4 |
InGaN growth and In composition control using DERI method |
Ritsumeikan@Univ., Dept. of Photonics1, Ritsumeikan Univ., R-GIRO2, Seoul National Univ.3@Ryosuke Iwamoto1, Tomohiro Yamaguchi2, Nao Uematsu1, Tsutomu Sakamoto1, Tatsuya Fujishima1, Tsutomu Araki1, Yasushi Nanishi1,3 |
|
5 |
Regularly arranged InGaN/GaN nano-parasols grown
by selective area growth of rf-MBE |
Sophia Univesity1, Sophia Nanotechnology Research Center2, CREST Japan Science and Technology Agency3@Hiroshi Hata1, Katsumi Kishino1,2,3, Tetsuya Kouno1,3, Akihiko Kikuchi1,2,3 |
|
|
Break 14:15`14:30 |
|
|
6 |
Novel Oxynitride InGaON Semiconductor Grown by RF-MBE (1)
- Controlling of O/N Composition Ratio in Ternary InON System -
|
Graduate School of Engineering, Chiba Univ.1, VBL, Chiba Univ.2@Yohei Takahashi1, Tatsuya Honma1, Kazuhide Kusakabe1,2, Yoshihiro Ishitani1,2, Akihiko Yoshikawa1,2 |
|
7 |
Novel Oxynitride InGaON Semiconductor Grown by RF-MBE (2)
- Growth of InN/InON Heterostructure - |
Graduate School of Engineering, Chiba Univ.1, VBL, Chiba Univ.2@Tatsuya Honma1, Yohei Takahashi1, Kazuhide Kusakabe1,2, Yoshihiro Ishitani1,2, Akihiko Yoshikawa1,2 |
’ |
8 |
Application of Wet Etching for InN Device Fabrication |
Ritsumeikan Univ., Dept. of Photonics1, ROSE2, R-GIRO3, NTT Photonics Labs., NTT Corporation4, Seoul National Univ.5@Akira Miki1, Morimoto Kenta1, Narihiko Maeda2,4, Tomohiro Yamaguchi3, Tsutomu Araki1, Yasushi Nanishi1,5 |
|
9 |
Epitaxial Lateral Overgrowth of InN by RF-MBE |
Sophia Univ.1, Sophia Nanotech. RC2, CREST JST3@iDjJumpei Kamimura1,3, Katsumi Kishino1,2,3, kouichi Kamiyama1, Inoue Ryohei1, Kikuchi Akihiko1,2,3 |
£ |
10 |
MBE Growth and Characterization of InN Quantum Dots |
ISIR, Osaka Univ.1@iPCjKrishnamurthy Daivasigamani1, Siti Nooraya Md Tawil1, Shigehiko Hasegawa1, Hajime Asahi1 |
|
11 |
Polarity control and growth mode of InN films on YSZ substrates |
The Univ. of Tokyo1, The Univ. of Tokyo2, The Univ. of Tokyo3, JST-CREST4@Atsushi Kobayashi1, Kana Okubo2, Jituso Ohta3, Hiroshi Fujioka3,4, Masaharu Oshima1,4 |
|
12 |
Epitaxial growth of In-rich m-plane InAlN films on ZnO substrates |
The University of Tokyo1, The University of Tokyo2, JST-CREST3@Tomofumi Kajima1, Kouhei Ueno2, Atsushi kobayashi1, Jitsuo Ohta2, Hiroshi Fujioka2,3, Masaharu Oshima2,3 |
|
|
Break 16:15`16:30 |
|
|
13 |
Effects of Cp2Mg supply on MOVPE growth behavior of InN |
Univ. of Fukui1@iPCjKen-ichi Sugita1, Akihiro Hashimoto1, Akio Yamamoto1 |
|
14 |
N-polar 1ML-InN/GaN Nanostructures Grown by MOVPE |
Graduate scool of electrical and Electronic Engineering, Chiba University1, VBL, Chiba University2@Atsushi Ueda1, Hiroshi Yamamoto1, Tatsuya Ryuzaki1, Kazuhide Kusakabe1,2, Yoshihiro Ishitani1,2, Akihiko Yoshikawa1,2 |
|
15 |
Crystal growth of InN by electric field MOCVD |
Tokai Univ.1@Yuichi Ota, Takashi Inushima |
|
16 |
MOVPE growth of semi-polar InN on GaAs(110) substrates |
Tokyo Univ. of Agri. & Tech.1@Hisashi Murakami1, Hyunchol Cho1, Mayu Suematsu1, Rie Togashi1, Yoshinao Kumagai1, Akinori Koukitu1 |
|
17 |
Growth Temperature Dependence of Phase Purity in InN Grown by Pressurized MOVPE |
IMR Tohoku Univ.1, Kyoto Inst. Technology2, JST-CREST3@Takeshi Kimura1,3, Yuhuai Liu1,3, Yuantao Zhang1,3, Kiattiwut Prasertsuk1, Jung Gon Kim2,3, Noriyuki Hasuike2,3, Hiroshi Harima2,3, Ryuji Katayama1,3, Takashi Matsuoka1,3 |
|
18 |
Temperature Dependence of Bandgap Energy of InN Grown by Pressurized Reactor MOVPE |
IMR, Tohoku Univ.1, JST-CREST2@Yuhuai Liu1,2, Takeshi Kimura1,2, Yuantao Zhang1,2, Kiattiwut Prasertsuk1, Takashi Hanada1,2, Ryuji Katayama1,2, Takashi Matsuoka1,2 |
15.4 III-V Nitride Epitaxial Growth |
Sept. 15 9:00`18:45 |
15a-B - 1`11 |
|
1 |
Reconsideration of Stress Effects in Semiconductors with Wurtzite Structure |
ISIR, Osaka University1@Shuichi Emura, Koun Shirai, Hajime Asahi |
|
2 |
Ionization Potential of 3d Transition Metal doped-?-N semiconductors |
Kyoto Institute of Technology1@Saki Sonoda1 |
|
3 |
Optical Absorption Property of 3d Transition Metal doped-?-N Films |
Kyoto Institute of Technology1@Saki Sonoda1 |
|
4 |
PL excitation spectroscopy of AlGaN epitaxial layers |
Yamaguchi Univ.1, Mie Univ.2@Ryo Kittaka1, Hideaki Murotani1, Hirotaka Muto1, Satoshi Kurai1, Yoichi Yamada1, Hideto Miyake2, Kazumasa Hiramatsu2 |
’ |
5 |
Si concentration dependence of optical polarization in AlGaN ternary alloys |
Yamaguchi Univ.1, Mie Univ.2@Hideaki Murotani1, Ryo Kittaka1, Hirotaka Muto1, Satoshi Kurai1, Yoichi Yamada1, Hideto Miyake2, Kazumasa Hiramatsu2 |
£ |
6 |
Inhomogeneous Broadening in Al-rich AlGaN/AlN Single Quantum Wells |
Kyoto Univ.1@iPjRyan Banal1, Mitsuru Funato1, Yoichi Kawakami1 |
|
|
Break 10:30`10:45 |
|
|
7 |
Complex refractive index of the AlGaN alloy over a wide photon energy region
|
Fac. Engi., Univ. Fukui1, Fac. Engi., Mie Univ.2@Hiroki Iwai1, Satoru Oda1, Kazutoshi Fukui1, Hideto Miyake2, Kazumasa Hiramatsu2 |
’ |
8 |
Characterization of optical properties for semipolar AlGaN films on ZnO |
IIS, The Univ. of Tokyo1, School of Engineering, The Univ. of Toyo2, JST-CREST3@iDjKohei Ueno1, Atsushi Kobayashi2, Jitsuo Ohta1, Hiroshi Fujioka1,3 |
|
9 |
Structural and optical-polarization properties of In-rich m-plane InGaN films grown on ZnO |
The Univ. of Tokyo1, The Univ. of Tokyo2, JST-CREST3@Hiroaki Tamaki1, Atsushi Kobayashi2, Jitsuo Ohta1, Masaharu Oshima2.3, Hiroshi Fujioka1,3 |
|
10 |
Optically pumped whispering gallery mode lasing action in a GaN hexagonal microdisk |
Sophia Univ.1, Sophia Nano.2, CREST3@iDCjTetsuya Kouno1,3, Katsumi Kishino1,2,3, Masaru Sakai1,3, Akihiko Kikuchi1,2,3 |
|
11 |
Optically pumped laseing property of GaN nanoring resonators |
Sophia Univ.1, Sophia Nanotech.2, JST@CREST3@Takuto Suzuki1, katsumi Kishino1,2,3, Tetsuya Kouno1,3, Akihiko Kikuchi1,2,3 |
|
|
Lunch 12:00`13:00 |
|
15p-B - 1`21 |
|
1 |
A breakdown of the quasicubic approximation in wurtzite structures |
Kyoto Univ.1@Ryota Ishii1, Akio Kaneta1, Mitsuru Funato1, Yoichi Kawakami1 |
|
2 |
Theoretical Investigation of optical properties on Nonpolar AlGaN/AlN Quantum Wells |
Kyoto Univ.1, Kanazawa Inst. Tech.2@Kazunobu Kojima1, Atsushi Yamaguchi2, Mitsuru Funato1, Yoichi Kawakami1, Susumu Noda1 |
|
3 |
Theoretical Investigation of the validity of quasicubic approximation |
Univ of Tsukuba1, Kanazawa Inst. of Tech2@Yasuhiro Ebihara1, Kenji Shiraishi1, Atsushi Yamaguchi2 |
|
4 |
A comprehensive understanding of previously-reported polarization properties in nonpolar and semipolar InGaN quantum wells |
Kanazawa Inst. Tech.1, Kyoto Univ.2@Atsushi A. Yamaguchi1, Kazunobu Kojima2 |
|
5 |
Dislocation density dependence of recombination dynamics in InGaN-based
quantum wells |
Yamaguchi Univ.1, Mitsubishi Chemical Corp.2@Yasuhiro Sudo1, Takakazu Kohno1, Masaki Yamauchi1, Satoshi Kurai1, Yoichi Yamada1, Hiromitsu Kudo2, Hiroaki Okagawa2 |
’ |
6 |
Carrier diffusion dynamics in InGaN SQW studied by spatial and temporal resolved PL spectroscopy
- efficiency droop mechanism assessed by SNOM-
|
Kyoto Univ.1@Akira Hashiya1, Akio Kaneta1, Mitsuru Funato1, Yoichi Kawakami1 |
|
7 |
Saturable Absorbing Dynamics of GaInN Multi-Quantum Well Structures |
NICHe Tohoku Univ.1, Advanced Materials Labs., Sony Corp.2@Takao Miyajima1,2, Hideki Watanabe2, Shunsuke Kono1, Tomoyuki Oki2, Rintaro Koda1,2, Masaru Kuramoto1,2, Masao Ikeda1,2, Hiroyuki Yokoyama1 |
|
8 |
Terahertz reflectance measurements of n,p-type GaN thin wafer |
Furukawa Co., Ltd.1, RIKEN Sendai2, Dept. Physics, Tohoku Univ.3, Powdec K. K.4@Akihide Hamano1, Akira Harako1, Seigo Ohno2,3, Hiroaki Minamide2, Hiromasa Ito2, Yoshiyuki Usuki1, Yasuhumi Watanabe1, Yasunobu Sumida4, Hiroji Kawai4 |
|
|
Break 15:00`15:15 |
|
’ |
9 |
Hydrogen gas evolution by Nitride photocatalyst with micro counterelectrodes |
Tokyo Univ. of Science1@Futami Sano1, Tomoe Hayasi1, Takahiro Koyama1, Akira Hirako1, Katushi Fujii2, Kazuhiro Ohkawa1 |
|
10 |
Effects of n-type GaN Characteristics for the Time Dependence of Water-Reduced Photocurrent to Produce Hydrogen |
CIR, Tohoku Univ.1@Katsushi Fujii1, Kayo Koike1, Mika Atsumi1, Takenari Goto1, Takafumi Yao1 |
|
11 |
Epitaxial Growth of GaN Films on Graphite Substrate |
Panasonic ATRL1, Panasonic SDRC2@Akio Matsushita1, Nobuaki Nagao1, Eiji Fujii1, Shinichi Kohda2, Toshiyuki Takizawa2 |
|
12 |
Fabrication of InGaN solar cells with high In concentrations |
The Univ. of Tokyo1, JST-CREST2@Shigeru Inoue1, Jitsuo Ohta1, Masaki Katoh1, Kazuya Tamura1, Hiroshi Fujioka1,2 |
|
13 |
Characterization of MQW layer in GaN light emitting diodes by X-ray diffraction |
Kobelco research institute, inc.1, Osaka Univ.2@Hideyuki Taguchi1, Amane Kitahara1, Shuji Kasaishi1, Aya Miyake1, Shugo Miyake1, Tadashi Toyoda1, Akimitsu Nakaue1, Atsushi Nishikawa2, Yasufumi Fujiwara2 |
’ |
14 |
Efficient Planarization of GaN Using Chemical Etching |
Osaka Univ.1, Ebara Corp.2@Shun Sadakuni1, Junji Murata1, Keita Yagi2, Yasuhisa Sano1, Kenta Arima1, Takeshi Okamoto1, kazuma Tachibana1, Kauzto Yamauchi1 |
|
15 |
Electroluminescence properties of p-GaN/MgO/Alq3 inorganic/organic hybrid devices |
Sophia univ.1, Sophia nanotechnol res ctr.2@Tomoyuki Tsuji1, Akihiko Kikuchi1,2 |
|
|
Break 17:00`17:15 |
|
|
16 |
Fabrication of light-emitting diode used on nonpolar GaN growth on the patterned sapphire substrate |
Grad. School of Sci. & Eng., Yamaguchi Univ.1@Shinichi Tabuchi1, Akihiro Kurisu1, Narihito Okada1, Kazuyuki Tadatomo1 |
|
17 |
Regularly arranged InGaN/GaN nanocolumn array green light emitting diodes |
Sophia Univ.1, Sophia Nanotechnol. Res. Ctr.2, JST CREST3@Meiki Goto1, Katsumi Kishino1,2,3, Kouji Yamano1,3, Akihiko Kikuchi1,2,3 |
|
18 |
Dependence of refractive index of stripe-patterned mask layers on light-extraction efficiency of InGaN Light-Emitting Diodes |
Yamaguchi Univ1, CHOSHU INDUSTRY2@Akimi Uchida1, Yuki Abe1, Narihito Okada1, Kazuyuki Tadatomo1, Koji Ibi2, Yoshi Watabe2 |
|
19 |
Dependence of the pillarfs height on the output power of the light emitting diodes fabricated on the nano-patterned sapphire substrate |
Yamaguchi Univ.1, SCIVAX Corp.2, SAMCO Inc.3@Taku Shinagawa1, Narihito Okada1, Kazuyuki Tadatomo1, Yutaka Taniguchi2, Hironobu Tamura2, Atsunori Maruno3, Michihiro Hiramoto3 |
|
20 |
Fabrication of LED on sapphire substrate with ZrO2 layer |
Meijo Univ.Fac.Sci.&Tech1, EL-SEED Corp2, Nagoya Univ3@Kenta Tamura1, Daisuke Iida1, Shuji Yamaguch1, Tosiyuki Kondou2, Motoaki Iwaya1, Tetuya Takeuti1, Satosi Kamiyama1,2, Isamu Akasaki1, Hirosi Amano3 |
|
21 |
Fabrication of high efficiency LED using moth-eye structure |
Fac. Sci. & Tech. Meijo Univ1, EL-SEED Corp2, Dept. Electronics & ARC, Nagoya Univ3@Hisashi Sakurai1, Toshiyuki Kondo2, Fumiharu Teramae2, Atushi Suzuki2, Tukasa Kitano2, Midori Mori2, Motoaki Iwaya1, Tetuya Takeuchi1, Satoshi Kamiyama1,2, Isamu Akasaki1, Hiroshi Amano3 |
15.4 III-V Nitride Epitaxial Growth |
Sept. 15 9:00`19:00 |
15a-C - 1`12 |
|
1 |
Growth and Mg doping of InxGa1-xN (x`0.6) by MOVPE |
Univ. of Fukui1, The Kansai EP2@Toru Hotta1, Kohei Sasamoto1, Ken-ichi Sugita1, Akihiro Hashimoto1, Akio Yamamoto1, Katsuhiro Kinoshita2, Yasuhito Kohji2 |
’ |
2 |
Selective MOVPE of InGaN/GaN MQW on semi-polar GaN stripes (II) |
Nagoya Univ.1, Akasaki@Research@Center2@iDjTomoyuki Tanikawa1,2, Tasuku Murase1,2, Yoshio Honda1,2, Masahito Yamaguchi1,2, Hiroshi Amano1,2 |
’ |
3 |
Microstructure of GaInN/GaInN superlattice on GaN substrate |
Meijo Univ.1, Nagoya Univ.2@iM1jToru Sugiyama1, Yasuhiro Isobe1, Yousuke Kuwahara1, Motoaki Iwaya1, Tetsuya Takeuchi1, Satoshi Kamiyama1, Isamu Akasaki1, Hiroshi Amano2 |
|
4 |
Growth of thick InGaN layer on {11-22} GaN template grown on patterned r-plane sapphire substrate
|
Grad. School of Sci. & Eng., Yamaguchi Univ.1@Akihiro Kurisu1, Yuki Abe1, Narihito Okada1, Kazuyuki Tadatomo1 |
|
5 |
Impact of InGaN growth conditions on structural stability under high temperature process in InGaN/GaN multiple quantum wells |
Corporate R&D Center, Toshiba Corp.1@Tomonari Shioda1, Toshiki Hikosaka1, Yoshiyuki Harada1, Koichi Tachibana1, Naoharu Sugiyama1, Shinya Nunoue1 |
|
6 |
Multicolor emission from InGaN multiple quantum wells on patterned n-plane sapphire substrate with offset angle
|
Grad. School of Sci. & Eng., Yamaguchi Univ.1, KYOCERA Corporation2@Masaki Takami1, Akihiro Kurisu1, Yuki Abe1, Narihito Okada1, Kazuyuki Tadatomo1, Motohiro Umehara2, Toshiyuki Ihara2, Satoru Tubokura2, Wataru Hujita2 |
|
|
Break 10:30`10:45 |
|
|
7 |
Continuous wavelength modulation of semi-polar InGaN/GaN MQWs with vapor-phase-diffusion-based selective-area pyramidal growth. |
Univ. of Tokyo.1, RCAST2@Tatsuki Fujiwara1, Yoshiaki Nakano2, Masakazu Sugiyama1 |
|
8 |
In-Situ Monitoring in Backend of GaN Epitaxy on Si by MOVPE |
Covalent Materials Corp.1@Jun Komiyama1, Hiroshi O-ishi1, Ken-ichi Eriguchi1, Akira Yoshida1, Yoshihisa Abe1, Shun-ichi Suzuki1, Hideo Nakanishi1 |
|
9 |
GaN film by means of voids fabricated by selective-avea growth |
Mie Univ.1@Sumito Ohuchi1, Hideto Miyake1, Kazumasa Hiramatsu1 |
|
10 |
Curvature anisotropy of a-plane GaN on r-sapphire |
Mie@Univ.1, Kyoto Inst. Tech.2@Bei Ma1, Jicai Zhang1, Hideto Miyake1, Kazumasa Hiramatsu1, Hiroshi Harima2 |
|
11 |
MOCVD selective are growth of GaN nanowires on sapphire substrates |
IIS, Univ. of Tokyo1, NanoQuine, Univ. of Tokyo2@Kihyun Choi1, Munetaka Arita2, Yasuhiko Arakawa1,2 |
|
12 |
MOCVD selective area growth of GaN nanowires on 6H-SiC substrates |
NanoQuine Univ. of Tokyo1, IIS Univ. of Tokyo2@Munetaka Arita1, Kihyun Choi2, Yasuhiko Arakawa1,2 |
|
|
Lunch 12:15`13:15 |
|
15p-C - 1`21 |
’ |
1 |
GaN-MOVPE simulation considering carbon incroporation |
Tokyo Univ. of Science.1@Kenichi Nakamura1, Akira Hirako1, Kazuhiro Ohkawa1 |
|
2 |
A Study on Thermal Stability of Silicon and Carbon Co-doping High Resistivity GaN |
New Japan Radio1@Masayuki Fukai1, Shusuke Kakizawa1, Hiroshi Fushimi1 |
|
3 |
Electrical conductivity of Si-doped boron nitride films grown by FME |
NTT BRL1@Yasuyuki Kobayashi1, Tetsuya Akasaka1 |
|
4 |
Impurity incorporation (1-101)GaN on patterned Si substrate |
Nagoya Univ.1, Akasaki Research Center2@Kouhei Yamashita, Yoshio Honda, Masahito Yamaguchi, Hiroshi Amano |
|
5 |
Fabrication of polarity inversion structure of GaN by using Mg-doping in MOVPE |
Shizuoka Univ.1, Shizuoka Univ.2, National Institute Materials Science3, Hamamatu@Photonics@K.K.4@tsuyoshi tachi1, tsutomu nogi1, takayuki nakano2, masatomo sumiya3, tokuaki nihashi4, minoru hagino4, syunro fuke2 |
|
6 |
Investigation of substrate temperature dependence of spiral and nucleus growth rates of GaN in MOVPE growth |
NTT Corp.1@Tetsuya Akasaka1, Yasuyuki Kobayashi1, Makoto Kasu1 |
|
|
Break 14:45`15:00 |
|
|
7 |
Low-temperature growth of GaN using catalyst-assisted MOVPE |
Univ. of Fukui1@Kohei Sasamoto1, Toru Hotta1, Mikiyasu Tanaka1, Ken-ichi Sugita1, Akihiro Hashimoto1, Akio Yamamoto1 |
|
8 |
Improvement of Surface Morphology for MOCVD Re-growth GaN using Ta mask |
The Univ. of Tokushima1, The Univ. of Tokushima2@Kohei Hara1, Yoshiki Naoi1,2, Shiro Sakai1,2 |
’ |
9 |
Optimization of the initial growth of non-polar m-plane and a-plane GaN grown on LPE-GaN substrates by Na flux method
|
Meijo Univ.1, Nagoya Univ. ARC2, Osaka Univ3@Yasuhiro Isobe1, Daisuke Iida1, Tatsuyuki Sakakibara1, Motoaki Iwaya1, Tetsuya Takeuchi1, Satoshi Kamiyama1, Isamu Akasaki1, Hiroshi Amano2, Mamoru Imade3, Yasuo Kitaoka3, Yusuke Mori3 |
|
10 |
Growth of nonpolar GaN on patterned sapphire substrate with nitridation |
Grad.School of Sci. & Eng.,Yamaguchi Univ.1@hiroyasu Oshita, Yuki Abe, Narihito Okada, Kazuyuki Tadatomo |
|
11 |
Selective Area Growth of GaN on Shallow Etched Sapphire Substrates |
Tokuyama Corp.1, Grad. School of Sci. & Eng., Yamaguchi Univ.2@Hiroshi Furuya1,2, Narihito Okada2, Kazuyuki Tadatomo2 |
|
12 |
Influence of MOVPE Growth Condition on Leakage Characteristics of InAlN/GaN Schottoky Contact |
NTT PH Labs.1@Masanobu Hiroki1, Narihiko Maeda1 |
|
13 |
MOVPE growth of InAlN/InGaN heterostructures with an intermediate In composition range |
Univ. of Fukui1@Mikiyasu Tanaka1, Kohei Sasamoto1, Ken-ichi Sugita1, Akihiro Hashimoto1, Akio Yamamoto1 |
|
|
Break 16:45`17:00 |
|
|
14 |
Characterization of AlInN epitaxial layer by MOCVD (2) |
Meikou Inst.1@Junki Ichikawa1, Yusuke Sakai1, Zhi Tao Chen1, Kazuhisa Fujita1, Takashi Egawa1 |
|
15 |
Spectroscopic characterization of AlxGa1-xN films and bandgap variation |
Kyoto Inst. Technology1, Wakayama Univ.2, Mie Univ.3@Atsuhito Kimura1, Junggon Kim1, Yasuhito Kamei1, Noriyuki Hasuike1, Kenji Kisoda2, Hiroshi Harima1, Yuki Shimahara3, Hideto Miyake3, Kazumasa Hiramatsu3 |
|
16 |
AlGaN/GaN Heterojunction Structure Grown on Single-crystal Diamond (111) Substrate |
NTT Basic Research Lab.1@Kazuyuki Hirama1, Yoshitaka Taniyasu1, Makoto Kasu1 |
|
17 |
Fabrication of Si-doped AlGaN for deep-ultraviolet light-source by EB excitation |
Mie Univ.1, HPK2@Yuki Shimahara1, Hideto Miyake1, Kazumasa Hiramatsu1, Fumitsugu Fukuyo2, Tomoyuki Okada2, Hidetsugu Takaoka2, Harumasa Yoshida2 |
£ |
18 |
The morphology and structural properties in two-step growth of m-AlN/GaN structures |
NanoQuine, Univ. of Tokyo1, IIS, Univ. of Tokyo2@Xuelin Yang1, Munetaka Arita1, Yasuhiko Arakawa1,2 |
|
19 |
Quantum confinement effect in deep-UV region of AlN/GaN short-period superlattices |
NTT BRL1@Yoshitaka Taniyasu1, Makoto Kasu1 |
’ |
20 |
New Nucleation Method by Annealing Mixed-polar AlN Buffer Layer |
R-GIRO, Ritsumeikan Univ.1@Masahito Kurouchi, Misaichi Takeuchi, Eunsook Hwang, Yoshinobu Aoyagi |
|
21 |
Raman Scattering Spectroscopy for Epitaxial AlN films |
Mie Univ.1, Kyoto Inst Tech.2@Shibo Yang1, Reina Miyagawa1, Jicai Zhang1, Hideto Miyake1, Kazumasa Hiramatsu1, Hiroshi Harima2 |
15.4 III-V Nitride Epitaxial Growth |
Sept. 16 9:00`12:30 |
16a-B - 1`13 |
|
1 |
Adjustment of InGaN/GaN MQW nanocolumn cavity structure on AlN/GaN DBR |
Sophia Univ.1, Sophia Nanotechnology Research Center2, CREST JST3@Ryuichi Araki1, Katsumi Kishino1,2,3, Shunsuke Ishizawa1,2,3, Takashi Ogawa1, Akihiko Kikuchi1,2,3 |
’ |
2 |
Optical properties of (1-101) InGaN/GaN MQW stripe laser structure on Si substrate |
Nagoya Univ.1@Tasuku Murase1, Tomoyuki Tanikawa1, Yoshio Honda1, Masahito Yamaguchi1, Hiroshi Amano1 |
|
3 |
B/C exciton emissions from AlN p-n junction LED |
NTT BRL1@Yoshitaka Taniyasu1, Makoto Kasu1 |
’ |
4 |
Transparent Electrode for Ultraviolet Light Emitting Diodes |
Meijo Univ.1, Nagoya Univ2@iM1jKousuke Takehara1, Kenichiro Takeda1, Kengo Nagata1, Hisashi Sakurai1, Motoaki Iwaya1, Tetsuya Takeuchi1, Satoshi Kamiyama1, Isamu Akasaki1, Hiroshi Amano1 |
’ |
5 |
100 mW Deep Ultraviolet Emission from Al-rich AlGaN/AlN Multiple Quantum Wells Pumped by an Electron Beam |
Kyoto Univ.1, Ushio Inc.2@Takao Oto1, Ryan Banal1, Ken Kataoka2, Mitsuru Funato1, Yoichi Kawakami1 |
|
6 |
Enhancement in the efficiency of AlGaN Deep-UV LEDs by using a high reflective Ni/Al p-type electrode |
RIKEN1, Saitama Univ.2, JST-CREST3@Masahiro Akiba1,2,3, Hideki Hirayama1,3, Yusuke Tsukada1,2,3, Noritoshi Maeda1,3, Norihiko Kamata2,3 |
|
|
Break 10:30`10:45 |
|
|
7 |
High Power AlGaN Deep-UV LEDs by using a Multiquantum-Barrier Electron-Blocking Layer |
RIKEN1, Saitama Univ.2, JST-CREST3@iM2jYusuke Tsukada1,2,3, Hideki Hirayama1,3, Masahiro Akiba1,2,3, Noritoshi Maeda1,3, Norihiko Kamata2,3 |
’ |
8 |
280nm-band InAlGaN deep UV LED on Si substrates |
RIKEN1, JST-CREST2@iPjSachie Fujikawa1,2, Hideki Hirayama1,2 |
|
9 |
Development of Continuous 10mW-class AlGaN UV LED Chip |
UV Craftory CO. Ltd.1, Meijyo Univ.2, Nagoya Univ.3@Shinya Fukahori1, Cyril Pernot1, Myunghee Kim1, Takehiko Fujita1, Tetsuhiko Inazu1, Yosuke Nagasawa1, Akira Hirano1, Masamichi Ipponmatsu1, Motoaki Iwaya2, Satoshi Kamiyama2, Isamu Akasaki2, Hiroshi Amano3 |
|
10 |
The development of high-peak-power picoseconds optical pulses sources based on a GaInN mode-locked semiconductor laser diode |
Sony Corp. Advanced Materials Lab.1, NICHe, Tohoku Univ.2@Tomoyuki Oki1, Rintaro Koda1,2, Takao Miyajima1,2, Hideki Watanabe1, Masaru Kuramoto1,2, Masao Ikeda1,2, Hiroyuki Yokoyama2 |
|
11 |
Development of 100 W peak power GaInN optical pulse source and application for nano-fabrication
|
NICHe Tohoku Univ.1, Advanced Materials Labs. Sony Corp2@Rintaro Koda1,2, Tomoyuki Oki2, Takao Miyajima1,2, Hideki Watanabe2, Masaru Kuramoto1,2, Masao Ikeda1,2, Hiroyuki Yokoyama1 |
|
12 |
High-temporal-resolution measurement of 405-nm-picosecond optical pulses |
NICHe, Tohoku Univ.1, Adv. Materials Labs., Sony Corp.2@Shunsuke Kono1, Tomoyuki Oki2, Rintaro Koda1,2, Hideki Watanabe2, Takao Miyajima1,2, Masaru Kuramoto1,2, Masao Ikeda1,2, Hiroyuki Yokoyama1 |
|
13 |
Characterization of ultraviolet laser diode on ELO AlGaN underlying layer |
Meijo Univ.1, Nagoya Univ. ARC2, Hamamatsu Photonics K.K3@Kenichirou Takeda1, Kengo Nagata1, Kousuke Takehara1, Hiroki Aoshima1, Syun Itou1, Yoshinori Oshimura1, Motoaki Iwaya1, Testuya Takeuchi1, Satoshi Kamiyama1, Hiroshi Amano1, Isamu Akasaki1, Sadaharu Yoshida3, Masakazu Kuwabara3, Youji Yamashita3, Hirofumi Kan3 |
15.4 III-V Nitride Epitaxial Growth |
Sept. 16 9:00`12:30 |
16a-C - 1`13 |
|
1 |
Preparation of ScAlN thin films by using ScAl alloy sputtering target |
AIST1, DENSO2@Morito Akiyama1, Tatsuo Tabaru1, Keiko Nishikubo1, Akihiko Teshigahara2, Kazuhiko Kano2 |
£ |
2 |
Electronic band structures of polar and nonpolar GaN/ZnO heterointerfaces determined by synchrotron radiation photoemission spectroscopy |
Univ.Tokyo1, JST-CREST2, Sync. Rad. Res. Org.3, Inst. Indust. Sci.4@Jiangwei Liu1, Atsushi Kobayashi1, Satoshi Toyoda1,2,3, Akira Kikuchi1, Jitsuo Ohta4, Hiroshi Fujioka4,2, Hiroshi Kumigashira1,2,3, Masaharu Oshima1,2,3 |
|
3 |
Characterization of electrical and magnetic properties of diluted magnetic semiconductor GaGdN and GaGdN/AlGaN heterostructures |
ISIR, Osaka Univ.1@Daijiro Abe1, Kotaro Higashi1, Yosuke Mitsuno1, Sachio Komori1, Yi-Kai Zhou1, Shuichi Emura1, Shigehiko Hasegawa1, Hajime Asahi1 |
’ |
4 |
Influence of Substrate Temperature and Nitrogen Gas Flow Ratio on Crystalline Quality of AlN Film Fabricated by Reactive Sputtering
|
IMRAM, Tohoku Univ.1@iM2jTomoyuki Kumada1, Makoto Ohtsuka1, Hiroyuki Fukuyama1 |
|
5 |
First-principle study on the adsorption process of group-V sources on the AlN(0001) surface |
Tokyo Univ. of Agri. & Tech.1@Hikari Suzuki1, Rie Togashi1, Hisashi Murakami1, Yoshinao Kumagai1, Akinori Koukitu1 |
|
6 |
Measurement of temperature dependent lattice constants of AlN and various starting substrates for the growth of AlN |
Tokyo Univ. of Agri. & Tech.1, Tokuyama Corporation2, Bruker AXS K. K.3@Miki Sakai1, Toru Nagashima2, Jumpei Tajima1, Rie Togashi1, Hisashi Murakami1, Hitoshi Morioka3, Tsutomu Yamauchi3, Keisuke Saito3, Yoshinao Kumagai1, Kazuya Takada2, Akinori Koukitu1 |
|
|
Break 10:30`10:45 |
|
|
7 |
Formation of an AlN layer on Si substrate by pulsed laser deposition |
Hirosaki Univ.1@iM1jDaiki Suzuki1, Hideki Nakazawa1 |
|
8 |
Initial stage of nitride growth on Rh(111) substrates |
The Univ. Tokyo1, The Univ. Tokyo2, JST-CREST3@Yuko Okano1, Shigeru Inoue1, Kohei Ueno1, Atsushi Kobayashi2, Jitsuo Ohta1, Masaharu Oshima2,3, Hiroshi Fujioka1,3 |
|
9 |
Growth mode of AlN on (γ3γ3 R30)SiON/6H-SiC nano surface |
Kyushu Univ.1@Yusaku Ishiyama1, Takashi Kajiwara1, Satoru Tanaka1 |
|
10 |
Thermal annealing of AlN/6H-SiC heteroepitaxial structure |
Tokai Univ.1@Mitsuru Ohneda3, Takashi Inushima1 |
’ |
11 |
Further Reduction of Threading Dislocation Density in 2H-AlN on 6H-SiC (0001) by Focusing Chemical Condition of SiC Surface
|
Kyoto Univ.1, Kyoto Univ. PESEC2@iDCjHironori Okumura1, Tsunenobu Kimoto1,2, Jun Suda1 |
’ |
12 |
Crystalline Quality of GaN Layers Grown on 6H-SiC(0001) Substrates with High-Quality AlN Templates by MBE |
Kyoto Univ.1, Kyoto Univ. PESEC2@Ryosuke Kikuchi1, Hironori Okumura1, Tsunenobu Kimoto1,2, Jun Suda1 |
’ |
13 |
Study on interface for AlN growth on sapphire substrate |
Mie Univ.1@Reina Miyagawa1, Hideto Miyake1, Kazumasa Hiramatsu1 |
15.5 Group-IV Crystals and IV-IV Alloys |
Sept. 14 13:30`17:45 |
14p-ZQ - 1`16 |
|
1 |
Strain Retention by Effect of Stress-Retainer on Source/Drain Regions of SSOI Islands |
MIRAI-TOSHIBA1, MIRAI-AIST2@Koji Usuda1, Yoshihiko Moriyama1, Vladimir Poborchii2, Tetsuya Tada2, Tsutomu Tezuka1 |
|
2 |
Formation of Strained Si with Flat and Uniformly Strained Surface by Sputter Epitaxy |
Univ. of Agric. & Technol.1, NICT2, Univ. of Southampton3@Hiroaki Hanafusa1, Nobumitsu Hirose2, Akifumi Kasamatsu2, Takashi Mimura2, Toshiaki Matsui2, Harold M. H. Chong3, Hiroshi Mizuta3, Yoshiyuki Suda1 |
|
3 |
Relation between hole mobility in (110)-oriented strained Si and crystalline morphology |
CCST, Univ. of Yamanashi1, IMR, Tohoku Univ.2, ARL, Tokyo City Univ.3@Yagi Sousuke1, Arimoto Keisuke1, Nakagawa Kiyokazu1, Usami Noritaka2, Nakajima Kazuo2, Sawano Kentarou3, Shiraki Yasuhiro3 |
|
4 |
Effect of defects induced by Ar+ or Si+ ion implantation on strain relaxation of SiGe layers |
Tokyo City Univ.1, Tohoku Univ.2, Univ. of Yamanashi3@Yusuke Hoshi1, Kentarou Sawano1, Noritaka Usami2, Keisuke Arimoto3, Kiyokazu Nakagawa3, Yasuhiro Shiraki1 |
|
5 |
Fabrication of relaxed SiGe buffer layers on Si (111) substrate by ion implantation technique |
Tokyo City Univ.1, Univ. of Yamanashi2@Satoshi Kubo1, Kentaro Sawano1, Yusuke Hoshi1, Kiyokazu Nakagawa2, Yasuhiro Shiraki1 |
|
6 |
Surface structure evaluation of uniaxially-strained SiGe fabricated by selective ion implantation technique |
Tokyo City Univ.1, Tohoku Univ.2, Yamanashi Univ.3@Soh Nagakura1, Yusuke Hoshi1, Kentaro Sawano1, Noritaka Usami2, Kiyokazu Nakagawa3, Yasuhiro Shiraki1 |
|
7 |
Stress Analysis of Thin Ge Film Grown by Sputter Epitaxy |
Univ. of Agric. & Technol.1, NICT2, Univ. of Southampton3@Hiroaki Hanafusa1, Nobumitsu Hirose2, Akifumi Kasamatsu2, Takashi Mimura2, Toshiaki Matsui2, Harold M.H Chong3, Hiroshi Mizuta3, Yoshiyuki Suda1 |
|
8 |
Formation of low-resistivity contact by high-density Sb delta-doping into Ge(111) |
Tokyo City Univ.1, Kyushu Univ.2, PRESTO JST3@Keigo Takeda1, Yusuke Hoshi1, Kenji Kasahara2, kazutaka Yamane2, Kentarou Sawano1, Kohei Hamaya2,3, Masanobu Miyao2, Yasuhiro Shiraki1 |
|
|
Break 15:30`15:45 |
|
|
9 |
Fabrication of high quality Fe3Si/SOI(111) contacts for spin-MOSFET applications |
Kyushu Univ.1, PRESTO-JST2, Osaka Univ.3, Covalent Silicon Corp.4@Yuzo Baba1, Tatsuhiko Murakami1, Naoki Hashimoto1, Yuichiro Ando1, Kohei Hamaya1,2, Jun Kikkawa3, Yoshiaki Nakamura3, Eiji Toyoda4, Koji Izunome4, Akira Sakai3, Masanobu Miyao1 |
|
10 |
Electric characterization of wafer?bonded Germanium(111)-on-Insulator substrates using 4-point-probe pseudo-MOSFET |
Osaka Univ.1, Covalent Silicon Co.2, Kyushu Univ.3@Keisuke Minami1, Yoshiaki Nakamura1, Jun Kikkawa1, Eiji Toyoda2, Koji Izunome2, Kohei Hamaya3, Masanobu Miyao3, Akira Sakai1 |
’ |
11 |
Fabrication of SiGe structure with high Ge concentration by rapid melt growth |
Osaka Univ.1@iM1jShimpei Ogiwara1, Chiaki Yoshimoto1, Takuji Hosoi1, Takayoshi Shimura1, Heiji Watanabe1 |
|
12 |
Anneal temperature dependence of Ge concentration in SGOI structure fabricated
by rapid melt growth
|
Osaka Univ.1@Shimpei Ogiwara1, yuichiro Suzuki1, Chiaki Yoshimoto1, Takuji Hosoi1, Takayoshi Shimura1, Heiji Watanabe1 |
’ |
13 |
Orientation-controlled Large Area GOI wih Mesh-Pattern Formed by SiGe Mixing Triggered Melting Growth
|
Dept. Electronics, Kyushu Univ.1@Yasuharu Ohta1, Kaoru Toko1, Taizoh Sadoh1, Masanobu Miyao1 |
|
14 |
Formation of Mosaic GOI (Ge on Insulator) for Epitaxial Template |
Dept. Electronics, Kyushu Univ.1@Hiroyuki Yokoyama1, Yuki Tojo1, Takashi Sakane1, Kaoru Toko1, Taizoh Sasoh1, Masanobu Miyao1 |
|
15 |
Dislocation structures in Ge thin layers epitaxially grown
on submicron regions of Si substrates |
Grad. Sch. Eng. Sci. Osaka Univ1, IMEC2@Shinji Harada1, Kohei Ebihara1, Jun Kikkawa1, Yoshiaki Nakamura1, Akira Sakai1, Wang Gang2, Caymax Matty2 |
’ |
16 |
Heavily Doping Technology for Strained Ge1-xSnx Layers |
Nagoya Univ.1, JSPS Research Fellow2, IMEC3, KUL4, Covalent Silicon5@Yosuke Shimura1,2, Shotaro Takeuchi1,5, Benjamin Vincent3, Geert Eneman3, Trudo Clarysse3, Andre Vantomme4, Johan Dekoster3, Matty Caymax3, Roger Loo3, Osamu Nakatsuka1, Shigeaki Zaima1 |
15.6 Group-IV Compounds |
Sept. 14 9:30`17:45 |
14a-ZS - 1`10 |
£ |
1 |
Stoichiometry simulation during SiC PVT crystal growth |
RIAM, Kyushu Univ.1, AIST2@Bing Gao1, Satoshi Nakano1, Xuejiang Chen1, Shin-ichi Nishizawa2, Koichi Kakimoto1 |
’ |
2 |
Influence of low frequency electromagnetic stirring on SiC solution growth |
Kyushu Univ.1, RIAM, Kyushu Univ.2@Fuminori Inui1, Bing Gao2, Satoshi Nakano2, Yoshihiro Kangawa1,2, Koichi Kakimoto1,2 |
£’ |
3 |
Numerical simulation of the AC magnetic field influence on silicon melt for SiC bulk crystal growth |
Adcanced Industrial Science and Technology1@iBjFrederic Mercier1, Shin-ichi Nishizawa1 |
|
4 |
Polytype control of SiC under continuous supply of CH4 gas in Li flux method |
Graduate School of Engineering, Osaka Univ.1@Yusuke Nakagawa1, Shin Takeuchi1, Mamoru Imade1, Masashi Yoshimura1, Yasuo Kitaoka1, Takatomo Sasaki1, Yusuke Mori1 |
|
5 |
Solution growth of thick SiC films under continuous supply of CH4 gas |
Graduate School of Engineering, Osaka Univ.1@Shin Takeuchi1, Yusuke Nakagawa1, Mamoru Imade1, Masashi Yoshimura1, Yasuo Kitaoka1, Takatomo Sasaki1, Yusuke Mori1 |
|
|
Break 10:45`11:00 |
|
|
6 |
SiC Film Deposition from SiH3CH3 at Low Temperatures |
Yokohama Nat. Univ.1@Yusuke Ando1, Hitoshi Habuka1 |
|
7 |
Polytype Transformation Process in Hetero-growth of 3C-SiC on 6H-SiC |
Nagoya Univ.1, MINATEC-LMGP2@Kazuaki Seki1, ander Alex1, Shigeta Kozawa1, Toru Ujihara1, Patrick Chaudouët2, Didier Chaussende2, Yoshikazu Takeda1 |
|
8 |
Low-Temperature, Ultrahigh-Rate Growth of 3C-SiC on Si substrate |
Tohoku Univ.1, JST-CREST2@Eiji Saito1, Maki Suemitsu1,2 |
|
9 |
High-speed and thick 4H-SiC epitaxial growth by the close spaced vertically blow type CVD reactor |
AIST1@Yuuki Ishida1, Tetsuo Takahashi1, Hajime Okumura1, Kazuo Arai1, Sadafumi Yoshida1 |
|
10 |
Reducing stacking faults in highly nitrogen doped 4H-SiC single crystal |
AIST1, DENSO CORPORATION2, Toyota Central R&D Labs., Inc.3, TOYOTA MOTOR CORPORATION4@Kazutoshi Kojima1, Tomohisa Kato1, Sachiko Ito1, Jun Kojima2, Husao Hirose2, Yasuo Kito2, Shoichi Yamauchi2, Koichi Nishikaw3, Ayumu Adachi4 |
|
|
Lunch 12:15`13:15 |
|
14p-ZS - 1`17 |
’ |
1 |
TEM & AFM study on surface and interface morphology of thermally grown SiO2 dielectrics on 4H-SiC(0001) substrates |
Osaka Univ.1, ROHM CO.,LTD2@Yusuke Uenishi1, Kohei Kozono1, Shuhei Mitani2, Yuki Nakano2, Takashi Nakamura2, Takuji Hosoi1, Takayoshi Shimura1, Heiji Watanabe1 |
|
2 |
Investigation of extrinsic factors causing reliability degradation of SiC MOS devices |
Osaka Univ.1, ROHM CO.,LTD2@Yusuke Uenishi1, Shuhei Mitani2, Yuki Nakano2, Takashi Nakamura2, Takuji Hosoi1, Takayoshi Shimura1, Heiji Watanabe1 |
|
3 |
Impact of Interface Roughness on Dielectric Breakdown of SiC Thermal Oxide |
AIST1@Junji Senzaki1, Atsushi Shimozato1, Kazutoshi Kojima1, Tomohisa Kato1, Yasunori Tanaka1, Hajime Okumura1 |
|
4 |
Photo Emission Analysis of Thermal Oxides Grown on n-type 4H-SiC (0001) Face |
AIST1, Hamamatsu Photonics2@Junji Senzaki1, Atsushi Shimozato1, Kazunari Koshikawa2, Yasunori Tanaka1, Kenji Fukuda1, Hajime Okumura1 |
|
5 |
Off-angle Dependence of Thermal Oxide Thickness for a- and m-face 4H-SiC |
NAIST1@Yoshihiro Ueoka1, Hiroshi Yano1, Tomoaki Hatayama1, Takashi Fuyuki1 |
’ |
6 |
Correlation between SiO2/SiC interface structure and conduction band offset |
Osaka Univ.1, JAEA2, ROHM CO., LTD3@Takashi Kirino1, Chanthaphan Atthawut1, Daisuke Ikeguchi1, Akitaka Yoshigoe2, Yuden Teraoka2, Syuhei Mitani3, Yuki Nakano3, Takashi Nakamura3, Takuji Hosoi3, Takayoshi Shimura1, Heiji Watanabe1 |
|
7 |
Dielectric constant of the SiON ultra-thin film on SiC |
Dpt. of Electronic-Engineering, the Univ. of Electro-Commun.1, Dpt. of Engineering-Sciences, the Univ. of Electro-Commun.2@Takuya Ohsugi1, Jun Nakamura1,2 |
’ |
8 |
Effects of NO Annealing on 4H-SiC MOSFETs with Deposited and Thermally Grown Oxides Fabricated on Various Crystal Faces |
Kyoto Univ.1@iDjYuichiro Nanen1, Jun Suda1, Tsunenobu Kimoto1 |
|
9 |
Interface state density of gate oxide on 3C-SiC with buried insulating layer (SiC-OI)
|
Kyushu Institute of Technology1@iM1jKennichi Urata1, Makoto Ikeno1, Motoi Nakao1 |
|
|
Break 15:30`15:45 |
|
|
10 |
Applicability Assessment of Two-Dimensional Model for Al Implantation into 4H-SiC |
FUPET1, Central Res. Lab.2@Kazuhiro Mochizuki1,2, Natsuki Yokoyama1,2 |
|
11 |
Ion-implanted Al activation energy determination in 4H-SiC by frequency break point of capacitance-frequency characteristic |
New Japan Radio1@Hengyu Xu1, Shuichi Ono1, Manabu Arai1, Kimiyoshi Yamasaki1 |
|
12 |
A Novel Cap Annealing Process for SiC Crystal using ECR-sputtered Carbon Films and
ECR Plasma Etching |
MES-AFTY Corp.1, Chiba Institute of Technology2, Kanagawa Industrial Technology Center3@Tetsuya Tajima1, Hironori Torii1, Shigeru Hirono1, Tomoyuki Kamata2, Kensuke Akiyama3, Yasuo Hirabayashi3 |
£ |
13 |
Effects of Ni/Nb thickness ratio on reaction microstructure and contact property with 4H-SiC |
Dept. of Materials Science, Tohoku University1@iDjKunhwa Jung, Keiichi Ito, Yuji Sutou, Junichi Koike |
’ |
14 |
Improvement of Schottky contact characteristics@by anodic oxidation on 4H-SiC
|
Nagoya Inst. of Tech1@iM1jMasaya Kimura1, Masasi Katou1, Masaya Ichimura1 |
|
15 |
Reverse I-V characteristics of SiC-SBDs with QPG(Quasi P-type Guard-ring) structure formed with several n-type epitaxial layer specifications |
New Japan Radio1@Shuichi Ono1, Satoru Ono1, Shuji Katakami1, Hengyu Xu1, Manabu Arai1, Kimiyoshi Yamasaki1 |
|
16 |
Improved Current Gain in 4H-SiC Bipolar Junction Transistors Passivated by Deposited Oxides with Post-Nitridation Annealing |
Kyoto Univ.1, PESEC, Kyoto Univ.2@iDjHiroki Miyake1, Tsunenobu Kimoto1,2, Jun Suda1 |
|
17 |
300C storage test of Au-Ge die attach system for SiC devices |
FUPET1, Nissan Motor2, Fuji Electric HD3, Toshiba4, Sanken Electric5, AIST6@Satoshi Tanimoto1,2, Kohei Matsui1,3, Kazuto Takao1,4, Shinji Sato1,5, Yoshinori Murakami1,2, Hiroshi Sato1,6, Hiroshi Yamaguchi1,6 |
15.6 Group-IV Compounds |
Sept. 15 9:15`12:30 |
15a-ZS - 1`12 |
|
1 |
Silicon Carbide Etching Reactor Design Using Chlorine Trifluoride Gas |
Yokohama Nat.Univ.1, Kanto Denka2, AIST3@Musashi Yumiya1, Yusuke Fukumoto1, Hitoshi Habuka1, Shinji Iizuka2, Katsuya Fukae2, Tomohisa Kato3 |
|
2 |
4H-SiC Surface Pits Formed due to Etching Using ClF3 Gas
|
Yokohama Nat. Univ.1, Kanto Denka2, AIST3@Kazuchika Furukawa1, Hitoshi Habuka1, Shinji Iizuka2, Katsuya Fukae2, Tomohisa Kato3 |
|
3 |
Fano interference effect in heavily doped n-type 4H-SiC crystal |
AIST1@Takeshi Mitani, Shinichi Nakashima, Tomohisa Kato, Kazutoshi Kojima, Hajime Okumura |
|
4 |
Photoluminescence Properties of Frank-type Defects in 4H-SiC Epilayer |
CRIEPI1@Isaho Kamata1, Xuan Zhang1, Hidekazu Tsuchida1 |
’ |
5 |
Evaluation of Long Carrier Lifetime of Very Thick 4H-SiC Epilayers |
Central Research Institute of Electric Power Industry1@Tetsuya Miyazawa1, Masahiko Ito1, Hidekazu Tsuchida1 |
£’ |
6 |
Correlation between thermal stress and formation of interfacial dislocations in 4H-SiC epilayers |
Central Research Institute of Electric Power Industry1@Xuan Zhang1, Masahiro Nagano1, Hidekazu Tsuchida1 |
|
|
Break 10:45`11:00 |
|
|
7 |
Noncontact evaluation of processed SiC by ultraviolet light irradiation |
Nagoya Inst. of Tech.1, Fujimi2@Kazumasa Nishio1, Kazuyuki Nagatoshi2, Osamu Eryu1 |
|
8 |
Influence of SiH4 addition exerted on SiC transformation by high-temperature annealing |
Fuji Electric Holdings Co., Ltd1, University of Tsukuba2@Yasuyuki Kawada1,2, Takeshi Tawara1, Shun-ichi Nakamura1, Tae Tawara1, Masahide Gotoh1, Noriyuki Iwamuro1, Katsuhiro Akimoto2 |
’ |
9 |
Reduction and Generation Mechanism of Deep Levels in SiC by Thermal Oxidation |
Kyoto Univ.1@Koutarou Kawahara1, Jun Suda1, Tsunenobu Kimoto1 |
|
10 |
A Theoretical Study on Si and C Emission into SiC Layer during Oxidation |
Saitama Univ.1, ADPERC AIST2@Yasuto Hijikata1, Shuhei Yagi1, Hiroyuki Yaguchi1, Sadafumi Yoshida2 |
|
11 |
Effects of electron irradiation induced defects on the transient charge collections of SiC diodes |
UEC1, JAEA2, AIST3@Naoya Iwamoto1,2, Shinobu Onoda2, Takahiro Makino2, Takeshi Ohshima2, Kazutoshi Kojima3, Shunpei Koike1, Atsushi Koizumi1, Kazuo Uchida1, Shinji Nozaki1 |
|
12 |
Radiation Resistance of Al-doped 4H-SiC Epilayer to 200keV Electron Irradiation |
OECU1, JAEA2@Takunori Nojiri1, Nishino Kouzou1, Hideki Yanagisawa1, Shinobu Onoda2, Takeshi Oshima2 |
15.7 Epitaxial Growth Fundamentals |
Sept. 14 |
14a-ZQ - 1`12 |
|
Short Presentation (5 min.) 10:30`11:30
14a-ZQ - 1`12@Poster Session 13:00`15:00 |
|
1 |
Theoretical Study of Twinning Formation on InP(111)A surface |
Mie Univ.1@Tomoki Yamashita
1, Toru Akiyama1, Kohji Nakamura1, Tomonori Ito1 |
|
2 |
First-principles calculations of the electron effective mass values in InN |
Tokyo Univ. of Science1@Tetsuya Wada1, Masatoshi Sano1 |
|
3 |
An ab initio-based approach to adsorption behavior of In on InAs wetting layer grown on GaAs(001) substrate |
Mie Univ.1@Kosuke Ogasawara1, Toru Akiyama1, Kohji Nakamura1, Tomonori Ito1 |
|
4 |
Theoretical investigations for the stability of InAs(111)A surface grown on GaAs |
Mie Univ.1@Tomonori Ito1, Naoki Ishimure1, Toru Akiyama1, Kohji Nakamura1 |
|
5 |
Surface reconstructions on InGaAs(001) and interface properties of HfO2/InGaAs |
NIMS1, AIST2@Akihiro Ohtake1, Noriyuki Miyata2, Yuji Urabe2, Tetsuji Yasuda2 |
|
6 |
Study of Structure Fluctuation during Molecular Beam Epitaxial Growth Using X-Ray Speckle Scattering |
JAEA1@Masamitu Takahasi1 |
£ |
7 |
Selective epitaxail growth of GaAs on star patterned (100) GaAs substrate |
Research Institute of Electronics, Shizuoka Univ.1@Mouleeswaran Deivasigamani1, Tadanobu Koyama1, Akira Tanaka1, Yasuhiro Hayakawa1 |
|
8 |
Preparation and Evaluation of ITO thin films by Metal Organic Decomposition |
Ryukoku Univ.1@Go Kageyama1, Toshihiro Nonaka1, Shin-ichi Yamamoto1 |
|
9 |
Study of growth condition for GaAs (001) microchannel epitaxy using temperature difference method of LPE
|
Meijo Univ1@Haruki Kojima1, Hidejiro Sato1, Masasi Kazama1, Sigeya Naritsuka1, Takahiro Maruyama1 |
|
10 |
Synthesis and Characterizations of CN Thin Films for White LED |
Ryukoku Univ.1, Tsuyama national college of technology2@Masaki Satake1, Shinpei Kishimoto2, Kunio Itoh2, Shin-ichi Yamamoto1 |
|
11 |
Time-resolved X-lay diffraction measurements of high-density InAs QDs during Sb-irradiated growth interruption (3) |
Univ.of.Electro-Comm.1, NIMS2, JAEA3@Kazuki Yamamoto1, Naoki Kakuda1, Toshiyuki Kaizu2, Masamitu Takahasi3, Seizi Fujikawa3, Koichi Yamaguchi1 |
|
12 |
Statistical Analysis of Surface Reconstruction Domains and Quantum Dot-Formation Pattern on InAs Wetting Layer |
Anan Natl. Col. Tech.1@Tomoya Konishi1, Shiro Tsukamoto1 |
15.8 Nano-impurities and defects |
Sept. 16 9:15`12:30 |
16a-ZT - 1`11 |
|
1 |
Development of vacancy evaluation technique for silicon crystal using ultrasonic measurements with P(VDF/TrFE) piezoelectric thin@film |
Graduate School of Science and Technology, Niigata Univ.1, MTC Co., Ltd.2, Center for Instrumental Analysis, Univ. of Toyama3, Center for Quantum Materials Science, Niigata Univ.4@Kazuki Okabe1, Keisuke Mitsumoto1, Takashi Yanase2, Mitsuhiro Akatsu1, Syotaro Baba1, Satoru Komatsu1, Yasushi Ono3, Yuichi Nemoto1, Hiroshi Yamada-Kaneta4, Terutaka Goto1 |
|
2 |
Localized electronic state of silicon monovacancy via ab initio calculations |
Graduate School of Science and Technology, Niigata Univ.1, Graduate School of Natural Science and Technology, Niigata Univ.2, Center for Quantum Materials Science, Niigata Univ.3@Takafumi Ogawa1, Kenji Tsuruta2, Hiroshi Iyetomi1, Yuichi Nemoto1, Hiroshi Yamada-Kaneta3, Terutaka Goto1 |
’ |
3 |
First Principles Calculation on Screw Defects at Si(110)/(100) Interface (2) |
Okayama Pref. Univ.1, Covalent Materials Co., Ltd.2@iDjHiroaki Kariyazaki1, Tatsuhiko Aoki1,2, Koji Izunome2, Koji Sueoka1 |
|
4 |
DLTS Measurements of Depth Profiles of Cu centers Formed in Si crystals Saturated with Cu |
Hitachi,Ltd., Hitachi Res. Lab.1@Minoru Nakamura1, Susumu Murakami1 |
|
5 |
Quantitative Analysis of Low Concentration Carbon in Silicon Wafer by Luminescence Activation Using Electron Irradiation (1) |
Covalent Silicon Corp.1, ISAS/JAXA2@Satoko Nakagawa1, Kazuhiko Kashima1, Michio Tajima2 |
|
6
|
Fine Structure Due to Donor-Acceptor Pair Luminescence in Si
|
ISAS/JAXA1, UMB2, ANU3@Michio Tajima1, Takaaki Iwai1, Hiroyuki Toyota1, Simona Binetti2, Dan Macdonald3
|
|
|
Break 11:00`11:15 |
|
|
7 |
Structural Elements of Ultrashallow Thermal Donors Formed in Silicon Crystals |
Tohoku Gakuin Univ.1, Tohoku Univ. IMR2@Akito Hara1, Teruyoshi Awano1, Yutaka Ohno2, Ichiro Yonenaga2 |
|
8 |
The effect of anneal for nanostructured Si chips |
NIMS1, Univ. Tsukuba2, Tohoku Univ.3, IMR, Tohoku Univ.4@Hisashi Onodera1,2, Jiwang Yan3, Shun Ito4, Takashi Sekiguchi1,2 |
|
9 |
DLTS measurement of Ge directly grown on Si substrate |
NIMS1, MIT2, Univ. Tokyo3@Kenichiro Kono1, Luan Hsin-Chiao2, Kazumi Wada3, Lionel Kimerling2 |
|
10 |
Growth control and impurity doping in Ge nanowires grwon by CVD method |
NIMS1, JST-PRESTO2@Naoki Fukata1,2, Keisuke Sato1, Takashi Sekiguchi1, Masanori Mitome1, Yoshio Bando1 |
|
11 |
Growth of AlC thin film by metal organic chemical vapor deposition |
ATS,@Univ. of Tokushima1, STS,@Univ. of Tokushima2@Fumiya Horie1, Yoshiki Naoi1,2, Shiro Sakai1,2 |