OYO BUTURI
,
Vol.79
, No.04 (2010)
Japanese
Preface
Ryuichi SHIMIZU
Objective
Analysis and evaluation technology that supports development of applied physics
"OYO BUTURI" Editorial Committee
Tutorial
Advanced electron microscopy for integrated local analysis
Eiji ABE
Analysis of materials and devices by electron holography
Tsukasa HIRAYAMA
Thin-film characterization techniques using reflection and diffraction of x-ray and synchrotron radiation
Shigeru KIMURA
Material characterization by means of positron annihilation
Akira UEDONO
Analysis of the industrial materials by terahertz sensing
Ryoichi FUKASAWA
Laser-assisted three-dimensional atom probe
Kazuhiro HONO
SIMS analysis of inorganic materials —State-of-the art high-resolution SIMS depth profiling—
Yuji KATAOKA
Novel SIMS techniques for organic and biological materials with
high-density excited primary ion beams
Jiro MATSUO
Surface analysis by medium energy ion scattering spectroscopy
Yoshiaki KIDO
Characterization of surface properties of nanomaterials by scanning probe microscopy
Masamichi YOSHIMURA
Evaluation of mechanical properties of thin-film materials using nanoindentation
Koji MIYAKE and Shinya SASAKI
Innovation in Japan —Semiconductor technology, intellectual property, and their exploitation by business—
Shunpei YAMAZAKI
Fundamental Lecture
What is coherence ?
Ryuji MORITA