OYO BUTURI, Vol.79, No.04 (2010)

• Preface
  • Ryuichi SHIMIZU
• Objective
  • Analysis and evaluation technology that supports development of applied physics
    "OYO BUTURI" Editorial Committee
• Tutorial
  • Advanced electron microscopy for integrated local analysis
    Eiji ABE
  • Analysis of materials and devices by electron holography
    Tsukasa HIRAYAMA
  • Thin-film characterization techniques using reflection and diffraction of x-ray and synchrotron radiation
    Shigeru KIMURA
  • Material characterization by means of positron annihilation
    Akira UEDONO
  • Analysis of the industrial materials by terahertz sensing
    Ryoichi FUKASAWA
  • Laser-assisted three-dimensional atom probe
    Kazuhiro HONO
  • SIMS analysis of inorganic materials —State-of-the art high-resolution SIMS depth profiling—
    Yuji KATAOKA
  • Novel SIMS techniques for organic and biological materials with
    high-density excited primary ion beams
    Jiro MATSUO
  • Surface analysis by medium energy ion scattering spectroscopy
    Yoshiaki KIDO
  • Characterization of surface properties of nanomaterials by scanning probe microscopy
    Masamichi YOSHIMURA
  • Evaluation of mechanical properties of thin-film materials using nanoindentation
    Koji MIYAKE and Shinya SASAKI
  • Innovation in Japan —Semiconductor technology, intellectual property, and their exploitation by business—
    Shunpei YAMAZAKI
• Fundamental Lecture
  • What is coherence ?
    Ryuji MORITA

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