Japanese
- Preface
- Objective
- Analysis and characterization in materials science and technology
"OYO BUTURI" Editorial Committee
- Comprehensive Research Report
- Tutorials
- Recent@Developments
- Our Research
- Technology Notes
- -Advanced characterization techniques for structural and electrical properties in highly-localized regions-
Application of focused ion beam fabrication equipped with microsampling system -TEM sampling technique for pin-point microstructure observation-
Masaaki SUGIYAMA
- A Nanotester : Point-contact current-imaging atomic force microscopy
Takuya MATSUMOTO and Tomoji KAWAI
- Discussion Space
- Developing publication ethics : Schon affair
Shigeaki YAMAZAKI
- Fundamental Lectures
- Scientific Information